US2011147438A1PendingUtilityA1
Clad solder thermal interface material
Est. expiryDec 23, 2029(~3.4 yrs left)· nominal 20-yr term from priority
H10W 72/877B23K 1/0016B23K 1/008B23K 35/02B23K 35/0233B23K 35/262B23K 35/3013B23K 2101/40Y10T428/12222
53
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Claims
Abstract
A clad solder thermal interface material is described. In one example the material has a first layer of solder, a second layer of solder clad to the first layer of solder, the second layer having a melting temperature lower than the melting temperature of the first layer, and a third layer of solder clad to the first layer of solder opposite the second layer, the third layer having a melting temperature lower than the melting temperature of the first layer.
Claims
exact text as granted — not AI-modified1 . A method comprising:
providing a first strip of solder having a melting temperature lower than a solder reflow furnace temperature and less than about 200° C.; providing a second strip of solder having a melting temperature higher than the first strip of solder higher than the solder reflow furnace temperature and higher than about 235° C.; providing a third strip of solder having a melting temperature lower than the second strip of solder lower than the solder reflow furnace temperature and less than about 200° C.; rolling the first, second, and third strips of solder to clad the second strip with the first and third strips.
2 . The method of claim 1 , wherein rolling comprises rolling to establish a metallurgical bond between the second strip and the first and third strips.
3 . The method of claim 1 , wherein the metallurgical bond is established by forcing the strips into contact without exposure to the ambient.
4 . The method of claim 1 , wherein the melting temperatures of the first and third strips are the same.
5 . (canceled)
6 . (canceled)
7 . The method of claim 1 , wherein the melting temperature of the second strip is above about 260° C.
8 . The method of claim 1 , wherein the second strip comprises at least one of AuSn and SnSb.
9 . The method of claim 1 , wherein the first and third strips comprise at least one of SnBi, SnIn and SnGa.
10 . The method of claim 1 , wherein the rolling is sufficient to cause a massive reduction in the cross-sectional area of the strips.
11 - 20 . (canceled)
21 . The method of claim 1 , further comprising applying the rolled strips to a semiconductor die as a solder thermal interface material.
22 . The method of claim 1 , further comprising melting the rolled strips to form a joint between a die and a die cover of a semiconductor package.
23 . The method of claim 22 , wherein the die cover comprises an integrated heat spreader and wherein the rolled strips are melted at the melting temperature of the first layer and of the second layer.
24 . The method of claim 1 , further comprising:
attaching a package cover to a die using the rolled strips, the package cover and the die forming at least a portion of a package; bonding the package cover to the die by melting the strips at a first temperature; attaching the package to a substrate after bonding the package cover by heating solder between the package and the substrate to a second temperature higher than the first temperature, wherein the second temperature does not melt the rolled strips.
25 . The method of claim 24 , wherein bonding the package cover comprises producing a homogenous material from the rolled strips with a higher melting temperature than the first temperature.
26 . The method of claim 25 , wherein the higher melting temperature is higher than the second temperature.
27 . The method of claim 24 , wherein bonding the package cover comprises bonding a first layer of cladding of the rolled strips to the package cover and bonding a second layer of cladding of the rolled strips to the die.Join the waitlist — get patent alerts
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