US2011207265A1PendingUtilityA1
Nonvolatile memory devices and method of manufacturing the same
Est. expiryFeb 1, 2027(~0.6 yrs left)· nominal 20-yr term from priority
H10W 40/10H10D 89/00H10B 63/10G11C 2213/79G11C 13/0004H10B 12/00
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Abstract
Example embodiments provide a nonvolatile memory device using resistive elements. The nonvolatile memory device may include a semiconductor substrate, a plurality of variable resistance patterns on the semiconductor substrate, and a plurality of heat sink patterns that are level with the variable resistance patterns and coupled to a ground voltage.
Claims
exact text as granted — not AI-modified1 . A method of manufacturing a nonvolatile memory device, the method comprising:
forming access transistors, which include gate electrodes formed on a semiconductor substrate and first and second junction regions formed in the semiconductor substrate on both ends of the gate electrodes; forming a ground voltage line coupled to the first junction region and landing pads coupled to the second junction region; forming variable resistance patterns on the landing pads; and forming heat sink patterns on the ground voltage line so that the heat sink patterns are adjacent to the variable resistance patterns.
2 . The method of claim 1 , wherein the heat sink patterns are level with the variable resistance patterns.
3 . The method of claim 1 , wherein the ground voltage line extends in a first direction.
4 . The method of claim 3 , wherein the heat sink patterns are formed on the ground voltage line so as to extend in the first direction.
5 . The method of claim 3 , wherein each of the heat sink patterns includes a first sub-heat sink pattern that is formed on the ground voltage line so as to extend in the first direction, and a second sub-heat sink pattern that extends in a second direction so as to cross the first direction.
6 . The method of claim 3 , wherein the heat sink patterns include a plurality of sub-heat sink patterns that is formed on the ground voltage line so as to be spaced apart from each other in the first direction.
7 . The method of claim 3 , further comprising:
forming spacers defining the widths of the heat sink patterns, respectively.Cited by (0)
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