Method for manufacturing optical disc master and method for manufacturing optical disc
Abstract
An apparatus for manufacturing an optical disc master, having (a) a turntable upon which is received a disc having a resist layer composed of a resist material, the resist material comprising an incomplete oxide of a transition metal on a substrate, the oxygen content of the incomplete oxide being smaller than the oxygen content of the stoichiometric composition corresponding to a valence of the transition metal, which increases the absorption of ultraviolet rays and visible light rays, the resist material being an amorphous inorganic material containing an oxide; and (b) an exposure system operatively configured to selectively expose the resist layer to ultraviolet rays or visible light.
Claims
exact text as granted — not AI-modified1 . An apparatus for manufacturing an optical disc master, comprising:
a turntable upon which is received a disc having a resist layer composed of a resist material, the resist material comprising an incomplete oxide of a transition metal on a substrate, the oxygen content of the incomplete oxide being smaller than the oxygen content of the stoichiometric composition corresponding to a valence of the transition metal, which increases the absorption of ultraviolet rays and visible light rays, the resist material being an amorphous inorganic material containing an oxide; and an exposure system operatively configured to selectively expose the resist layer to ultraviolet rays or visible light.
2 . The apparatus of claim 1 , wherein the exposure system is operatively configured to expose the resist layer to a light beam having an irradiation power that is less than an irradiation threshold power at which exposure of the resist starts.
3 . An apparatus for manufacturing an optical disc master, comprising:
a turntable upon which is received a disc having a resist layer composed of a resist material, the resist material comprising an incomplete oxide of a transition metal on a substrate, the oxygen content of the incomplete oxide being smaller than the oxygen content of the stoichiometric composition corresponding to a valence of the transition metal, which increases the absorption of ultraviolet rays and visible light rays, the resist material being an amorphous inorganic material containing an oxide; a light source; a light source control unit operatively configured to control the light source, and a lens system which configures light from the light source as a light beam which is directed onto the disc; wherein,
the apparatus selectively exposes the resist layer to ultraviolet rays or visible light.
4 . The apparatus of claim 3 , wherein the exposure system is operatively configured to expose the resist layer to a light beam having an irradiation power that is less than an irradiation threshold power at which exposure of the resist starts.
5 . The apparatus of claim 3 , further comprising:
a collimator lens through which light from the light source travels; a beam splitter operatively positioned and configured to split light from the collimator lens into a first beam and a second beam; an objective lens operatively configured and positioned to focus the first beam onto the disc; a split photo detector operatively positioned and configured to receive via the light from beam splitter light which has reflected from the disc; a converging lens between the beam splitter and the split photo detector; and a focus actuator operatively configured to adjust the position of the objective lens relative to the turntable, wherein,
the split photo detector is configured to generate a focus error signal based on a comparison of the second beam and the reflected light, and
the focus actuator is configured to adjust the position of the objective lens in accordance with the focus error signal.
6 . The apparatus of claim 3 , wherein, the light source is a laser.Join the waitlist — get patent alerts
Track US2011279793A1 — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.