Controlled process and resulting device
Abstract
A method for forming a multi-material thin film includes providing a multi-material donor substrate comprising single crystal silicon and an overlying film comprising GaN or SiC. Energetic particles are introduced through a surface of the multi-material donor substrate to a selected depth within the single crystal silicon. The method includes providing energy to a selected region of the donor substrate to initiate a controlled cleaving action in the donor substrate. Then, a cleaving action is made using a propagating cleave front to free a multi-material film from a remaining portion of the donor substrate, the multi-material film comprising single crystal silicon and the overlying film.
Claims
exact text as granted — not AI-modified1 - 51 . (canceled)
52 . A method comprising:
providing a multi-material donor substrate comprising single crystal silicon and an overlying film comprising GaN or SiC; introducing energetic particles through a surface of the multi-material donor substrate to a selected depth within the single crystal silicon; providing energy to a selected region of the donor substrate to initiate a controlled cleaving action in the donor substrate; and making a cleaving action using a propagating cleave front to free a multi-material film from a remaining portion of the donor substrate, the multi-material film comprising single crystal silicon and the overlying film.
53 . A method as in claim 52 wherein introducing the energetic particles comprises introducing hydrogen.
54 . A method as in claim 53 wherein introducing hydrogen comprises introducing hydrogen at an energy of about 1 MeV.
55 . A method as in claim 53 wherein introducing hydrogen comprises introducing hydrogen at a dose of about 10 16 atoms/cm 2 .
56 . A method as in claim 52 wherein a temperature of the multi-material substrate does not exceed 400° C. during the introducing.
57 . A method as in claim 52 wherein the providing energy comprises applying energy from a thermal source.
58 . A method as in claim 57 wherein the thermal source comprises a photon beam.
59 . A method as in claim 52 wherein the making the cleaving action comprises applying energy from a compressional source.
60 . A method as in claim 59 wherein the compressional source comprises compressed fluid that is static.
61 . A method as in claim 59 wherein the compressional source comprises pressurized gas.
62 . A method as in claim 61 wherein the making the cleaving comprises applying the pressurized gas to a sealed chamber.
63 . A method as in claim 62 wherein a pressure differential exists between a pressure within the sealed chamber and ambient pressure.
64 . A method as in claim 62 wherein the pressure within the sealed chamber forces the multi-material film to separate from the remaining portion by a prying action.
65 . A method as in claim 62 further comprising adjusting the pressure within the sealed chamber during the cleaving action.
66 . A method as in claim 65 wherein a temperature of the multi-material substrate does not exceed 400° C. during the cleaving action.
67 . A method as in claim 65 wherein the temperature of the multi-material substrate does not exceed 350° C. during the cleaving action.
68 . A method as in claim 59 wherein the making the cleaving action comprises applying additional energy from a mechanical source.
69 . A method as in claim 68 wherein the mechanical source comprises a compressional mechanical energy source.
70 . A method as in claim 52 wherein the making the cleaving action comprises applying energy from a mechanical source.
71 . A method as in claim 70 wherein the mechanical source is derived from compressional energy.Join the waitlist — get patent alerts
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