US2011303448A1PendingUtilityA1
Pb-Free Sn-Ag-Cu-Al or Sn-Cu-Al Solder
Est. expiryApr 23, 2030(~3.8 yrs left)· nominal 20-yr term from priority
H05K 3/346B23K 35/0244B23K 35/001B23K 35/262C22C 13/00
46
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Claims
Abstract
A solder alloy includes Sn, optional Ag, Cu, and Al wherein the alloy composition is controlled to provide a strong, impact-and thermal aging-resistant solder joint that has beneficial microstructural features and is substantially devoid of Ag 3 Sn blades.
Claims
exact text as granted — not AI-modified1 . An alloy consisting essentially of about 3 to about 4 weight % Ag, about 0.7 to about 1.7 weight % Cu, about 0.01 to about 0.25 weight % Al, and balance consisting essentially of Sn.
2 . The alloy of claim 1 having a solidus temperature of about 217° C.
3 . The alloy of claim 2 having a liquid plus solid temperature range less than about 5 degrees C.
4 . The alloy of claim 1 having tin dendrites, a ternary eutectic between the dendrites, and pro-eutectic particles adjacent and/or within the tin dendrites in an as-solidified microstructure.
5 . The alloy of claim 4 wherein the pro-eutectic particles comprise Cu 6 Sn 5 .
6 . The alloy of claim 4 wherein the alloy is as-solidified at less than 5° C./second.
7 . The alloy of claim 1 having an Al content selected to form particles in the solder that comprise Cu and Al.
8 . The alloy of claim 7 wherein the particles comprises substantially Cu 33 Al 17 .
9 . A solder alloy consisting essentially of about 3.4 to about 3.6 weight % Ag, about 0.8 to about 1.1 weight % Cu, about 0.03 to about 0.20 weight % Al, and balance consisting essentially of Sn.
10 . A solder alloy consisting essentially of about 3.45 to about 3.55 weight % Ag, about 0.75 to about 1.0 weight % Cu, about 0.04 to about 0.15 weight % Al, and balance consisting essentially of Sn.
11 . A solder alloy consisting essentially of about 3 to about 4 weight % Ag, 0.95-y weight % Cu, and y weight % Al and balance consisting essentially of Sn wherein y is about 0.01 to about 0.25 weight %.
12 . A solder alloy comprising Sn, Ag, Cu, and Al and having a solidus temperature of about 217° C. and a narrow liquid-solid mushy zone with a liquidus temperature not exceeding about 5° C. above the solidus temperature.
13 . A solder alloy for BGA applications, consisting essentially of about 3.45 to about 3.55 weight % Ag, about 0.80 to about 1.0 weight % Cu, about 0.10 to about 0.20 weight % Al, and balance consisting essentially of Sn.
14 . A solder alloy consisting essentially of about 0.7 to about 3.5 weight % Cu, about 0.01 to about 0.25 weight % Al, and balance consisting essentially of Sn.
15 . The solder alloy of claim 11 consisting essentially of about 0.8 to about 3.2 weight % Cu, about 0.03 to about 0.25 weight % Al, and balance consisting essentially of Sn.
16 . The alloy of claim 11 consisting essentially of about 0.95 to about 3.0 weight % Cu, about 0.15 to about 0.20 weight % Al, and balance consisting essentially of Sn.
17 . A solder alloy consisting essentially of about 3.20-y weight % Cu, and y weight % Al and balance consisting essentially of Sn wherein y is about 0.15 to about 0.25 weight %.
18 . A solder joint comprisng a Sn—Ag—Cu—Al solder alloy soldified in contact with an electrical conductor wherein the solder joint has an as-solidified microstructure that comprises tin dendrties, ternary eutectic between tin dendrites, and pro-eutectic Cu 6 Sn 5 particles adjacent and/or within the tin dendrites and that is substantially devoid of Ag 3 Sn blades.
19 . The joint of claim 18 having an interfacial layer comprising Cu 6 Sn 5 and an adjacent metastable intermediate rejected solute region as a zone of intermediate hardness between the interfacial layer and the solder tin matrix.
20 . The joint of claim 18 wherein the solder alloy consists essentially of about 3 to about 4 weight % Ag, about 0.7 to about 1.7 weight % Cu, about 0.01 to about 0.25 weight % Al, and balance consisting essentially of Sn.
21 . The joint of claim 20 wherein the solder alloy consists essentially of about 3.4 to about 3.6 weight % Ag, about 0.8 to about 1.1 weight % Cu, about 0.03 to about 0.20 weight % Al, and balance consisting essentially of Sn.
22 . The joint of claim 21 wherein the solder alloy consists essentially of about 3.45 to about 3.55 weight % Ag, about 0.75 to about 1.0 weight % Cu, about 0.04 to about 0.15 weight % Al, and balance consisting essentially of Sn.
23 . The joint of claim 18 formed on an electrical wiring board.
24 . The joint of claim 18 formed about copper electrical conductors.
25 . The joint of claim 18 having particles in and/or adjacent a solder joint interface layer wherein the particles comprise Cu and Al.
26 . The joint of claim 25 wherein the particles comprises substantially Cu 33 Al 17 .
27 . A thermally-aged solder joint comprising a Sn—Ag—Cu—Al solder alloy in contact with an electrical conductor wherein the solder joint has an interfacial layer thickness that is about the same as the thickness of the interfacial layer in the as-solidified solder before thermal aging.
28 . The joint of claim 27 wherein the interfacial layer thickness is no more than 30% greater than the thickness of the interfacial layer in the as-solidified solder before thermal aging.
29 . The joint of claim 27 wherein the solder alloy consists essentially of about 3 to about 4 weight % Ag, about 0.7 to about 1.7 weight % Cu, about 0.01 to about 0.25 weight % Al, and balance consisting essentially of Sn.
30 . A solder joint comprisng a Sn—Ag—Cu—Al solder alloy soldified in contact with an electrical conductor wherein the solder joint has an as-solidified microstructure that comprises an interfacial layer comprising Cu 6 Sn 5 and an adjacent metastable intermediate Al-containing rejected solute region between the interfacial layer and the solder tin matrix, wherein the hardness of the Al-containing rejected solute region is intermediate the hardness of the interfacial layer and the solder tin matrix.
31 . The joint of claim 30 formed on an electrical wiring board.
32 . The joint of claim 30 formed about copper electrical conductors.
33 . The joint of claim 30 wherein the solder alloy consists essentially of about 3 to about 4 weight % Ag, about 0.7 to about 1.7 weight % Cu, about 0.01 to about 0.25 weight % Al, and balance consisting essentially of Sn.
34 . The joint of claim 33 wherein the solder alloy consists essentially of about 3.4 to about 3.6 weight % Ag, about 0.8 to about 1.1 weight % Cu, and about 0.03 to about 0.20 weight % Al, and balance consisting essentially of Sn.
35 . The joint of claim 34 wherein the solder alloy consists essentially of about 3.45 to about 3.55 weight % Ag, about 0.75 to about 1.0 weight % Cu, and about 0.04 to about 0.15 weight % Al, and balance consisting essentially of Sn.
36 . The joint of claim 30 having particles in and/or adjacent the solder joint interfacial layer wherein the particles comprise Cu and Al.
37 . The joint of claim 36 wherein the particles comprises substantially Cu 33 Al 17 .
38 . In a soldering process, the step of solidifying a molten Pb-free solder consisting essentially of about 3 to about 4 weight % Ag, about 0.7 to about 1.7 weight % Cu, and about 0.01 to about 0.25 weight % Al, and balance consisting essentially of Sn.
39 . The process of claim 38 wherein the solder is solidified on an electrical wiring board.
40 . The process of claim 38 wherein the solder is solidified about copper electrical conductors.
41 . The process of claim 38 including forming buoyant particles comprising Cu and Al in the molten solder.
42 . In a solder paste reflow or BGA solder process, the step of solidifying a molten Pb-free solder consisting essentially of about 3 to about 4 weight % Ag, about 0.7 to about 1.7 weight % Cu, and about 0.01 to about 0.25 weight % Al, and balance consisting essentially of Sn.
43 . The process of claim 42 wherein the solder is cooled at a rate to form an as-solidified microstructure that comprises tin dendrites, ternary eutectic between the tin dendrites, and pro-eutectic Cu 6 Sn 5 particles adjacent and/or within the tin dendrites and that is substantially devoid of Ag 3 Sn blades.
44 . The process of claim 42 that forms an interfacial layer comprising Cu 6 Sn 5 and an adjacent metalstable intermediate rejected solute region as a zone of intermediate hardness between the interfacial layer and the solder tin matrix.
45 . The process of claim 42 wherein the solder is solidified on an electrical wiring board.
46 . The process of claim 42 wherein the solder is solidified about copper electrical conductors.
47 . The process of claim 42 wherein the solder alloy consists essentially of about 3.45 to about 3.55 weight % Ag, about 0.80 to about 1.0 weight % Cu, about 0.10 to about 0.20 weight % Al, and balance consisting essentially of Sn.
48 . A solder ball comprising an alloy consisting essentially of about 3 to about 4 weight % Ag, about 0.7 to about 1.7 weight % Cu, about 0.01 to about 0.25 weight % Al, and balance consisting essentially of Sn.
49 . The solder ball of claim 48 having a liquid plus solid temperature range less than. about 5 degrees C.
50 . The solder ball of claim 48 wherein the alloy consists essentially of about 3.4 to about 3.6 weight % Ag, about 0.8 to about 1.1 weight % Cu, about 0.03 to about 0.20 weight % Al, and balance consisting essentially of Sn.
51 . The solder ball of claim 50 wherein the solder alloy consists essentially of about 3.45 to about 3.55 weight % Ag, about 0.75 to about 1.0 weight % Cu, about 0.04 to about 0.15 weight % Al, and balance consisting essentially of Sn.
52 . The solder ball of claim 50 wherein the solder alloy consists essentially of about 3.45 to about 3.55 weight % Ag, about 0.80 to about 1.0 weight % Cu, about 0.10 to about 0.20 weight % Al, and balance consisting essentially of Sn.Cited by (0)
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