US2012000423A1PendingUtilityA1
Hdp-cvd system
Est. expiryAug 18, 2028(~2.1 yrs left)· nominal 20-yr term from priority
H10P 14/69215H10P 14/6336H10P 14/6334H10P 14/6506H10W 10/17H10W 10/014C23C 16/401C23C 16/0209C23C 16/045
46
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Abstract
An HDP-CVD system is described, including an HDP-CVD chamber for depositing a material on a wafer, and a pre-heating chamber disposed outside of the HDP-CVD chamber to pre-heat the wafer, before the wafer is loaded in the HDP-CVD chamber, to a temperature higher than room temperature and required in the deposition step to be conducted in the HDP-CVD chamber. The pre-heating chamber is equipped with a heating lamp for the pre-heating. The wafer has been formed with a trench before being pre-heated.
Claims
exact text as granted — not AI-modified1 . An HDP-CVD system, comprising:
an HDP-CVD chamber for depositing a material on a wafer; and a pre-heating chamber disposed outside of the HDP-CVD chamber to pre-heat the wafer, before the wafer is loaded into the HDP-CVD chamber, to a temperature higher than room temperature and required in an deposition step to be conducted in the HDP-CVD chamber, wherein the pre-heating chamber is equipped with a heating lamp for the pre-heating, and the wafer has been formed with a trench before being pre-heated.
2 . The HDP-CVD system of claim 1 , wherein the pre-heating chamber and the HDP-CVD chamber are integrated in a cluster tool.
3 . The HDP-CVD system of claim 1 , wherein the pre-heating chamber is capable of pre-heating only one wafer each time.
4 . The HDP-CVD system of claim 1 , wherein the pre-heating chamber is capable of pre-heating two or more wafers simultaneously.
5 . The HDP-CVD system of claim 1 , wherein the material deposited is an insulating material.
6 . The HDP-CVD system of claim 5 , wherein the insulating material is silicon oxide.
7 . The HDP-CVD system of claim 6 , wherein the temperature to which the wafer is pre-heated is between 300° C. and 800° C.Cited by (0)
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