Microscope and ghosting elimination method

Abstract

A microscope includes a first imaging optical system that images sample transmitted light transmitted through a sample provided on a stage, and a second imaging optical system that images a part of the sample transmitted light branched from the first imaging optical system. Here, the second imaging optical system includes a light beam branching element that branches the part of the sample transmitted light from the first imaging optical system, and has a thickness of a predetermined threshold or more, an imaging element that images a phase difference image of the branched sample transmitted light, one or a plurality of optical elements that images an image of the phase difference image of the branched sample transmitted light on the imaging element, and a filter that shields a part of the branched sample transmitted light imaged on the imaging element.

The application is claimed as follows: 
     
         1 . A microscope, comprising:
 a first imaging optical system that images sample transmitted light transmitted through a sample provided on a stage; and   a second imaging optical system that images a part of the sample transmitted light branched from the first imaging optical system,   wherein the second imaging optical system includes   a light beam branching element that branches the part of the sample transmitted light from the first imaging optical system, and has a thickness of a predetermined threshold or more,   an imaging element that images a phase difference image of the branched sample transmitted light,   one or a plurality of optical elements that images an image of the phase difference image of the branched sample transmitted light on the imaging element, and   a filter that shields a part of the branched sample transmitted light imaged on the imaging element.   
     
     
         2 . The microscope according to  claim 1 , wherein the sample transmitted light reflected by the light beam branching element is imaged in the first imaging optical system, and
 the phase difference image of the sample transmitted light transmitted through the light beam branching element is imaged in the second imaging optical system.   
     
     
         3 . The microscope according to  claim 1 , wherein the sample transmitted light transmitted through the light beam branching element is imaged in the first imaging optical system, and
 the phase difference image of the sample transmitted light reflected by the light beam branching element is imaged in the second imaging optical system.   
     
     
         4 . The microscope according to  claim 2 , wherein the filter is a diaphragm in which a through hole set for allowing a luminous flux set which becomes the phase difference image to pass therethrough is provided, and
 the thickness of the light beam branching element has a larger value than a feature value calculated based on a diameter of the through hole, a center distance between the through holes of the through hole set, and a luminous flux diameter at a position of the filter of the sample transmitted light.   
     
     
         5 . The microscope according to  claim 4 , wherein the thickness of the light beam branching element has a larger value than a feature value calculated based on the following Inequality 1, which is represented as 
       
         
           
             
               
                 
                   
                     t 
                     > 
                     
                       k 
                       × 
                       
                         
                           ( 
                           
                             
                               φ 
                                
                               
                                   
                               
                                
                               a 
                             
                             + 
                             
                               φ 
                                
                               
                                   
                               
                                
                               b 
                             
                             + 
                             d 
                           
                           ) 
                         
                         2 
                       
                     
                   
                 
                 
                   
                     Math 
                     . 
                     
                         
                     
                      
                     1 
                   
                 
               
             
           
         
         where t denotes a thickness of the light beam branching element, k denotes a specific constant in an optical system, φa denotes a luminous flux diameter at a filter position of the sample transmitted light, φb denotes a diameter of the through hole, and d denotes a center distance of through holes of the through hole set. 
       
     
     
         6 . A ghosting elimination method, comprising:
 branching, by a light beam branching element having a thickness of a predetermined threshold or more, a part of sample transmitted light transmitted through a sample provided on a stage; and   shielding, by an imaging element for imaging a phase difference image of the branched sample transmitted light and a filter provided between the imaging element and the light beam branching element, ghosting light caused by a corresponding light beam branching element from the part of the sample transmitted light branched by the light beam branching element.