US2012072615A1PendingUtilityA1

Programmable Management IO Pads for an Integrated Circuit

50
Individually held — no corporate assignee on recordPriority: Oct 29, 2002Filed: Nov 28, 2011Published: Mar 22, 2012
Est. expiryOct 29, 2022(expired)· nominal 20-yr term from priority
Inventors:Hoang TranHoward Baumer
G06F 13/4027H04L 43/50Y04S40/00
50
PatentIndex Score
0
Cited by
0
References
0
Claims

Abstract

A method for performing Iddq testing including receiving an Iddq message and executing the Iddq message to measure current leakage.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . A method for performing Iddq testing, comprising:
 receiving, at a logic circuit coupled to a programmable pad, an Iddq message;   receiving, at a controller, the Iddq message, the controller being one of an input controller and an output controller; and   executing, at the logic circuit, the Iddq message to measure current leakage.   
     
     
         2 . A system for performing Iddq testing, comprising:
 a programmable pad;   a logic circuit coupled to the programmable pad and configured to receive an Iddq message and to execute the Iddq message to measure current leakage; and   a controller configured to receive the Iddq message, the controller being one of an input controller and an output controller.

Join the waitlist — get patent alerts

Track US2012072615A1 — get alerts on status changes and closely related new filings.

We store only your email — no account needed. See our privacy policy.