US2012103588A1PendingUtilityA1
Heat-dissipating substrate
Est. expiryNov 2, 2030(~4.3 yrs left)· nominal 20-yr term from priority
H05K 2203/0315H05K 2201/0338H05K 1/053
42
PatentIndex Score
0
Cited by
0
References
0
Claims
Abstract
Disclosed herein is a heat-dissipating substrate in order to improve heat-dissipating characteristics. The heat-dissipating substrate, comprising: a copper layer having a predetermined thickness; anodized insulating layers formed on upper and lower surfaces of the copper layer; and aluminum (Al) layers formed between the copper layer and the anodized insulating layer. Therefore, a heat-dissipating function of the base made of the aluminum (Al) layer and the copper (Cu) layer is improved, thereby making it possible to provide a high-output metal substrate appropriate for high-integration/high capacity electronic components.
Claims
exact text as granted — not AI-modified1 . A heat-dissipating substrate, comprising:
a copper layer having a predetermined thickness; and anodized insulating layers formed on upper and lower surfaces of the copper layer.
2 . The heat-dissipating substrate as set forth in claim 1 , further comprising aluminum (Al) layers formed between the copper layer and the anodized insulating layer.
3 . The heat-dissipating substrate as set forth in claim 2 , further comprising:
a seed layer formed on the part of anodized insulating layer; and a metal layer formed on the seed layer.
4 . The heat-dissipating substrate as set forth in claim 2 , wherein the anodized insulating layer is formed on the surface of the aluminum layer through an anodizing process.
5 . The heat-dissipating substrate as set forth in any one of claim 2 , wherein the aluminum layers are formed at a thickness of 0.02 mm˜0.2 mm.
6 . The heat-dissipating substrate as set forth in claim 2 , wherein the copper layer and the aluminum layers are formed at a thickness ratio of 2:2 to 3:1.
7 . The heat-dissipating substrate as set forth in claim 4 , wherein the seed layer is performed by electroless plating or sputtering deposition.
8 . The heat-dissipating substrate as set forth in claim 4 , wherein the metal layer is performed by wet plating or dry sputtering deposition.
9 . The heat-dissipating substrate as set forth in claim 4 , wherein the seed layer is formed on the entire surface of anodized insulating layer, the metal layer is formed on the seed layer, and a part of the seed layer and the metal layer is removed by wet chemical etching, electrolytic etching or lift-off.
10 . A heat-dissipating substrate, comprising:
a copper layer having a first area and second area of the upper surface or lower surface, and a predetermined thickness; aluminum layers formed on first area of the upper surface or the lower surface; and anodized insulatings layer formed on second area of the upper surface or the lower surface of the copper layer.
11 . The heat-dissipating substrate as set forth in claim 10 , further comprising:
a seed layer formed on the part of anodized insulating layer; and a metal layer formed on the seed layer.
12 . The heat-dissipating substrate as set forth in claim 10 , wherein the anodized insulating layer is formed on the surface of the aluminum layer through an anodizing process.
13 . The heat-dissipating substrate as set forth in claim 10 , wherein the aluminum layers are formed at a thickness of 0.02 mm˜0.2 mm.
14 . The heat-dissipating substrate as set forth in claim 10 , wherein the copper layer and the aluminum layers are formed at a thickness ratio of 2:2 to 3:1.
15 . The heat-dissipating substrate as set forth in claim 11 , wherein the seed layer step is performed by electroless plating or sputtering deposition.
16 . The heat-dissipating substrate as set forth in a claim 11 , wherein the metal layer is performed by wet plating or dry sputtering deposition.
17 . The heat-dissipating substrate as set forth in claim 11 , wherein the seed layer is formed on the entire surface of anodized insulating layer, the metal layer is formed on the seed layer, and a part of the seed layer and the metal layer is removed by wet chemical etching, electrolytic etching or lift-off.Cited by (0)
No later patents cite this yet.
References (0)
No backward citations on record.