Methods and systems for the directing and energy filtering of x-rays for non-intrusive inspection

Abstract

Systems and methods are disclosed herein for lenses based on crystal X-ray diffraction and reflection to be used to direct and energy filter X-ray beams

1 . A method for illuminating a target to analyze its contents, comprising:
 a) providing a source of photons in an X-ray energy range including photons of energy greater than 100 keV;   b) locating a crystal lens comprised of a plurality of lens surfaces arranged in at least one concentric circle, at a predetermined location relative to the photon source such that a beam of photons from the photon source is incident on said plurality of lens surfaces at least one preselected angle of incidence to the surfaces; and   c) locating a target at a predetermined location relative to the crystal lens such that a plurality of photons from the photon beam in a preselected energy range are diffracted by the lens surfaces to be incident on a preselected portion of the target.   
     
     
         2 . The method of  claim 1 , wherein the diffraction is Laue diffraction. 
     
     
         3 . The method of  claim 1 , wherein the crystal surfaces are composed of an element chosen from a group consisting of carbon, copper, silicon and germanium. 
     
     
         4 . The method of  claim 1 , wherein the crystal surfaces are composed of an element chosen from a group consisting of silver and gold. 
     
     
         5 . A system for illuminating a target to analyze its contents, comprising:
 a) a source of photons in an X-ray energy range including photons of energy greater than 100 keV;   b) a crystal lens comprised of a plurality of lens surfaces arranged in at least one concentric circle, at a predetermined location relative to the photon source such that a beam of photons from the photon source is incident on said plurality of lens surfaces at least one preselected angle of incidence to the surfaces; and   c) a target at a predetermined location relative to the crystal lens such that a plurality of photons from the photon beam in a preselected energy range are diffracted by the lens surfaces to be incident on a preselected portion of the target.   
     
     
         6 . The system of  claim 5 , wherein the diffraction is Laue diffraction. 
     
     
         7 . The system of  claim 5 , wherein the crystal surfaces are composed of an element chosen from a group consisting of carbon, copper, silicon and germanium. 
     
     
         8 . The method of  claim 5 , wherein the crystal surfaces are composed of an element chosen from a group consisting of silver and gold. 
     
     
         9 . A method for illuminating a target to analyze its contents, comprising:
 a) providing a source of photons in a preselected X-ray energy range including photons of energy greater than 100;   b) locating a crystal lens at a predetermined location and orientation relative to the photon source such that a beam of photons from the photon source is incident on said lens at a preselected angle of incidence; and   c) locating a target at a predetermined location relative to the crystal lens such that a plurality of photons from the photon are diffracted by the lens to be incident on a preselected portion of the target.   
     
     
         10 . The method of  claim 9 , wherein the diffraction is Laue diffraction. 
     
     
         11 . The method of  claim 9 , wherein the diffraction is Bragg diffraction. 
     
     
         12 . The method of  claim 9 , wherein the crystal lens is composed of an element chosen from a group consisting of carbon, copper, silicon and germanium. 
     
     
         13 . The method of  claim 9 , wherein the crystal lens is composed of an element chosen from a group consisting of silver and gold. 
     
     
         14 . A system for illuminating a target to analyze its contents, comprising:
 a) a source of photons in a preselected X-ray energy range including photons of energy greater than 100 keV;   b) a crystal lens at a predetermined location and orientation relative to the photon source such that a beam of photons from the photon source is incident on said lens at a preselected angle of incidence; and   c) a target at a predetermined location relative to the crystal lens such that a plurality of photons from the photon beam are diffracted by the lens to be incident on a preselected portion of the target.   
     
     
         15 . The system of  claim 14 , wherein the diffraction is Laue diffraction. 
     
     
         16 . The system of  claim 14 , wherein the diffraction is Bragg diffraction. 
     
     
         17 . (The system of  claim 14 , wherein the crystal lens is composed of an element chosen from a group consisting of carbon, copper, silicon and germanium. 
     
     
         18 . The method of  claim 14 , wherein the crystal lens is composed of an element chosen from a group consisting of silver and gold. 
     
     
         19 . A method for illuminating a target to analyze its contents, comprising:
 a) providing a source of photons comprising photons at a range of X-ray energies including photons of energy greater than 100 keV;   b) locating a crystal lens comprised of a plurality of lens surfaces arranged in at least one concentric circle, at a predetermined location relative to the photon source such that a beam of photons from the photon source is incident on said plurality of lens surfaces at least one preselected angle of incidence to the surfaces;   c) locating at least one absorber at a predetermined location relative to the crystal lens such that photons from the photon source below a preselected energy are diffracted by the lens surfaces to be incident on the at least one absorber; and   d) locating a target at a predetermined location relative to the crystal lens such that a plurality of photons from the photon beam above the preselected energy are diffracted by the lens surfaces to be incident on a preselected portion of the target.   
     
     
         20 . The method of  claim 19 , wherein the diffraction is Laue diffraction. 
     
     
         21 . The method of  claim 19 , wherein the crystal surfaces are composed of an element chosen from a group consisting of carbon, copper, silicon and germanium. 
     
     
         22 . The method of  claim 19 , wherein the crystal surfaces are composed of an element chosen from a group consisting of silver and gold. 
     
     
         23 . A system for illuminating a target to analyze its contents, comprising:
 a) a source of photons comprising photons at a range of X-ray energies including photons of energy greater than 100 keV;   b) a crystal lens comprised of a plurality of lens surfaces arranged in at least one concentric circle, at a predetermined location relative to the photon source such that a beam of photons from the photon source is incident on said plurality of lens surfaces at least one preselected angle of incidence to the surfaces;   c) at least one absorber at a predetermined location relative to the crystal lens such that photons from the photon source below a preselected energy are diffracted by the lens surfaces to be incident on the at least one absorber; and   d) a target at a predetermined location relative to the crystal lens such that a plurality of photons from the photon beam above the preselected energy are diffracted by the lens surfaces to be incident on a preselected portion of the target.   
     
     
         24 . The system of  claim 23 , wherein the diffraction is Laue diffraction. 
     
     
         25 . The system of  claim 23 , wherein the crystal surfaces are composed of an element chosen from a group consisting of carbon, copper, silicon and germanium. 
     
     
         26 . The method of  claim 23 , wherein the crystal surfaces are composed of an element chosen from a group consisting of silver and gold.