US2012149139A1PendingUtilityA1

Low-cost large-screen wide-angle fast-response liquid crystal display apparatus

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Assignee: TANAKA SAKAEPriority: Jun 15, 2006Filed: Dec 22, 2011Published: Jun 14, 2012
Est. expiryJun 15, 2026(expired)· nominal 20-yr term from priority
G02F 1/13625G02F 1/1362G02F 1/134336G02F 1/1333G02F 1/1343G02F 1/1337G02F 1/136231G09G 3/3648G09G 2310/0218G02F 1/133707G02F 1/134363G02F 1/136236G09G 2310/0283G02F 1/13712G02F 1/134372
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Claims

Abstract

A method of fabricating an IPS active matrix substrate, and said substrate constituting an active matrix display device, characterized in that: a photolithographic procedure is performed for three times for the manufacture: forming a gate electrode, a comb pixel electrode, a common electrode for shielding a video signal line (or a source electrode), a contact pad in said pixel electrode, and a video signal line for shielding said contact pad in common electrode, forming a separate thin film semiconductor layer component, and a contact hole, forming a source electrode, a drain electrode, a common electrode at the center of a pixel and a comb common electrode, such that after an ohmic contact layer of a channel portion of said thin film transistor is dry etched, a partial film of a passivation layer is formed by a silicon nitride film by using a mask deposition method is provided.

Claims

exact text as granted — not AI-modified
1 . A method of fabricating an IPS active matrix substrate, and said substrate constituting an active matrix display device, characterized in that: a photolithographic procedure is performed for three times for the manufacture:
 (1) forming a gate electrode, a comb pixel electrode, a common electrode for shielding a video signal line (or a source electrode), a contact pad in said pixel electrode, and a video signal line for shielding said contact pad in common electrode (wherein said photolithographic procedure uses a halftone exposure method for the first time);   (2) forming a separate thin film semiconductor layer component, and a contact hole (wherein said photolithographic procedure uses a halftone exposure method for the second time);   (3) forming a source electrode (or video signal line), a drain electrode, a common electrode at the center of a pixel and a comb common electrode (wherein said third time of photolithographic procedure uses a halftone exposure method), such that after an ohmic contact layer of a channel portion of said thin film transistor is dry etched, a partial film of a passivation layer is formed by a silicon nitride film by using a mask deposition method (wherein said film is formed at a terminal portion other than those of a gate electrode, a source electrode and a common electrode).

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