US2012170714A1PendingUtilityA1
Methods and apparatus for e-beam scanning
Est. expiryJul 5, 2025(expired)· nominal 20-yr term from priority
H01J 2235/068G01N 23/2252H05G 1/70H01J 35/14H05G 1/52G01V 5/22
53
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Claims
Abstract
In one aspect, an x-ray scanning device is provided. The x-ray scanning device comprises a target adapted to convert electron-beam (e-beam) energy into x-ray energy, a detector array positioned to detect at least some x-rays emitted from the target, and a conveyer mechanism adapted to convey items to be inspected through an inspection region formed by the target and the detector array, wherein the target and the detector array are rotated out of alignment with each other such that x-rays emitted from the target impinge on diametrically positioned detectors of the detector array without passing through near-side detectors of the detector array.
Claims
exact text as granted — not AI-modified1 . An x-ray scanning device comprising:
at least one target adapted to convert electron beam (e-beam) energy into x-ray energy, the at least one target arranged to provide at least some of the x-ray energy through an inspection region, the inspection region including an imaging plane wherein a cross-section of the an object being scanned is exposed to the x-ray energy; and at least one first array of detectors adapted to detect x-ray radiation emitted from the at least one target and passing through the inspection region, the at least one detector array including a first substantially linear detector array and a second substantially linear detector array, the first substantially linear detector array and the second substantially linear detector array being arranged substantially perpendicular to each other, wherein the at least one target and the at least one first array of detectors are offset with respect to one another in a first direction substantially perpendicular to the imaging plane.
2 . The x-ray scanning device of claim 1 , wherein the first substantially linear detector array and the second substantially linear detector array form a substantially L-shaped detector array.
3 . The x-ray scanning device of claim 1 , further comprising a third substantially linear detector array arranged substantially parallel to the first substantially linear detector array, wherein the first, second and third substantially linear detector arrays are arranged to form a substantially U-shaped detector array.
4 . The x-ray scanning device of claim 1 , further comprising at least one second array of detectors offset from the at least one target in a second direction, the second direction being substantially opposite to the first direction.
5 . The x-ray scanning device of claim 4 , wherein the first substantially linear detector array and the second substantially linear detector array form a first substantially L-shaped detector array and the at least one second array of detectors includes a third substantially linear detector array and a fourth substantially linear detector array arranged substantially perpendicular to each other to form a second substantially L-shaped detector array.
6 . The x-ray scanning device of claim 5 , wherein the first substantially L-shaped detector and the second substantially L-shaped detector array are arranged substantially diametric to each another.
7 . The x-ray scanning device of claim 1 , further comprising a conveyor mechanism adapted to convey objects through the imaging plane, and wherein the at least one target and the at least one first array of detectors are offset with respect to one another substantially in the direction in which the conveyor mechanism conveys the objects through the imaging plane.
8 . The x-ray scanning device of claim 1 , comprising a first e-beam source and a second e-beam source, each configured to generate e-beam energy and arranged to generate a first e-beam and a second e-beam, respectively, and wherein the at least one deflector is configured to direct the first e-beam to the at least one target along a first scanning path over a first portion of the at least one target and direct the second e-beam to the at least one target along a second scanning path over a second portion of the at least one target.Cited by (0)
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