Electronic component handler having gap set device

Abstract

A gap set device for an electronic component handler is provided. The electronic component handler includes a test accessory mounted to it. The test accessory is movable between a first position away from a tool and a second position closer to the tool. A gap set device is mounted to the test accessory and the tool and has a portion movable with respect to the test accessory. When the test accessory is in the second position, the portion of the gap set device contacts the component support structure to define a gap between the test accessory and the component support structure.

1 - 21 . (canceled) 
     
     
         22 . An electronic component handler comprising:
 a component support structure received on a support surface of the handler;   a test accessory mounted to the handler for movement between a first position remote from the component support structure and a second position closer to the component support structure than the first position; and   a gap set device mounted to the test accessory and having a portion movable with respect to the test accessory, wherein the portion of the gap set device is configured to contact the component support structure such that a gap is defined between the test accessory and the component support structure when the test accessory is in the second position.   
     
     
         23 . The electronic component handler of  claim 22  wherein the gap set device comprises a pneumatic cylinder having an extendable shaft, the extendable shaft mounted to contact the component support structure and wherein an airflow through the extendable shaft is obstructed when the extendable shaft contacts the component support structure. 
     
     
         24 . The electronic component handler of  claim 23  wherein the extendable shaft includes a shoulder extending therefrom for engagement with a flange to limit movement of the extendable shaft relative to the pneumatic cylinder. 
     
     
         25 . The electronic component handler of  claim 24  wherein the flange is machined into the test accessory. 
     
     
         26 . The electronic component handler of  claim 22 , further comprising:
 a test accessory support coupled to the handler and the test accessory, the test accessory support configured to guide movement of the test accessory between the first position and the second position.   
     
     
         27 . The electronic component handler of  claim 26 , further comprising:
 a lock engaged with the test accessory support to fix a position of the test accessory relative to the component support structure.   
     
     
         28 . The electronic component handler of  claim 22 , further comprising:
 a kinematic coupling configured to adjust an orientation of the test accessory relative to the component support structure.   
     
     
         29 . The electronic component handler of  claim 28  wherein the kinematic coupling includes a plurality of pins on the support surface of the handler and a plurality of adjustable mounts positioned on a base of a component supporting the test accessory, the plurality of pins positioned for engagement with respective ones of the plurality of pins. 
     
     
         30 . The electronic component handler of  claim 22  wherein the test accessory is a load frame and the component support structure is a test plate. 
     
     
         31 . The electronic component handler of  claim 22  wherein the gap set device comprises a pneumatic cylinder with an extendable shaft mounted therein and through the test accessory. 
     
     
         32 . An electronic component handler of  claim 22 , further comprising:
 at least one borehole through the gap set device to permit inspection of the gap.   
     
     
         33 . A method comprising:
 arranging a first component support structure on a support surface of an electronic component handler;   after arranging the first component support structure on the support surface, moving a test accessory and a gap set device toward the first component support structure, the test accessory movable relative to the support surface and the gap set device coupled to the test accessory and having a portion movable with respect to the test accessory, such that the portion of the gap set device contacts the first component support structure and the test accessory is spaced apart from the component support structure to define a gap between the test accessory and the first component support structure; and   after defining the gap, moving the portion of the gap set device relative to the test accessory and away from the first component support structure.   
     
     
         34 . The method of  claim 33 , further comprising:
 fixing a position of the test accessory relative to the support surface after defining the gap and before moving the portion of the gap set device away from the first component support structure.   
     
     
         35 . The method of  claim 33  wherein the first component support structure defines a first plane and the test accessory defines a second plane, the method further comprising:
 adjusting the test accessory to make the second plane parallel with the first plane. 
 
     
     
         36 . The method of  claim 33  wherein moving the test accessory toward the first component support structure comprises linearly moving the test accessory. 
     
     
         37 . The method of  claim 33 , further comprising:
 inspecting the gap through at least one borehole extending through the gap set device.   
     
     
         38 . The method of  claim 33 , further comprising:
 moving the test accessory away from the first component support structure;   after moving the test accessory away from the first component support structure, removing the first component support structure from the support surface;   after removing the first component support structure from the support surface, arranging a second component support structure on the support surface; and   after arranging the second component support structure on the support surface, moving the test accessory and the gap set device toward the second component support structure such that the portion of the gap set device contacts the second component support structure and the test accessory is spaced apart from the second component support structure to define a gap between the test accessory and the second component support structure.   
     
     
         39 . The method of  claim 33 , further comprising:
 maintaining the gap between the test accessory and the first component structure while moving the portion of the gap set device away from the first component support structure.   
     
     
         40 . A method comprising:
 moving a test accessory and a gap set device away from a first component support structure disposed on a support surface of an electronic component handler, the test accessory movable relative to the support surface and the gap set device coupled to the test accessory and having a portion movable with respect to the test accessory;   replacing the first component support structure with a second component support structure;   after replacing the first component support structure with the second component support structure, moving the test accessory and the gap set device toward the second component support structure such that the portion of the gap set device contacts the second component support structure and the test accessory is spaced apart from the second component support structure to define a gap between the test accessory and the second component support structure; and   after defining the gap, moving the portion of the gap set device relative to the test accessory and away from the second component support structure.   
     
     
         41 . The method of  claim 40 , further comprising:
 maintaining the gap between the test accessory and the second component structure while moving the portion of the gap set device away from the second component support structure.