US2012270392A1PendingUtilityA1
Fabricating method of active device array substrate
Est. expiryMar 22, 2030(~3.7 yrs left)· nominal 20-yr term from priority
H10D 86/441H10D 86/60H10D 30/6743H10D 30/6739H10D 30/6737C23C 14/165C23C 14/3492
46
PatentIndex Score
0
Cited by
0
References
0
Claims
Abstract
A fabricating method of an active device array substrate is provided. The active device array substrate has at least one patterned conductive layer. The patterned conductive layer includes a copper layer. A cross-section of the copper layer which is parallel to a normal line direction of the copper layer includes a first trapezoid and a second trapezoid stacked on the first trapezoid. A base angle of the first trapezoid and a base angle of the second trapezoid are acute angles, and a difference between the base angle of the first trapezoid and the base angle of the second trapezoid is from about 5° to about 30°.
Claims
exact text as granted — not AI-modified1 . A fabricating method of an active device array substrate, comprising:
depositing a first copper layer at a first deposition rate on a substrate; depositing a second copper layer at a second deposition rate on the first copper layer, wherein the first deposition rate is substantially greater than the second deposition rate; and patterning the first copper layer and the second copper layer.
2 . The fabricating method of the active deice array substrate as claimed in claim 1 , wherein after the first copper layer and the second copper layer are patterned, a first cross-section of the first copper layer which is substantially parallel to a normal line direction of the first copper layer is a first trapezoid, a second cross-section of the second copper layer which is parallel to the normal line direction of the first copper layer is a second trapezoid, a base angle of the first trapezoid and a base angle of the second trapezoid are acute angles, and a difference between the base angle of the first trapezoid and the base angle of the second trapezoid is from about 5° to about 30°.
3 . The fabricating method of the active device array substrate as claimed in claim 1 , wherein a depositing method of the first copper layer and the second copper layer comprises sputtering.
4 . The fabricating method of the active device array substrate as claimed in claim 1 , wherein the first deposition rate is at least two times the second deposition rate.
5 . The fabricating method of the active device array substrate as claimed in claim 1 , further comprising depositing a barrier layer on the substrate before the step of depositing the first copper layer, wherein the first copper layer is deposited on the barrier layer.Cited by (0)
No later patents cite this yet.
References (0)
No backward citations on record.