Detecting, measuring and controlling particles and electromagnetic radiation

Abstract

A method is provided for detecting, measuring or controlling particles and/or electromagnetic radiation, comprising providing a deformable material containing a deformable aperture defining a path for particles or radiation, adjusting the deformable aperture to a prescribed geometry and/or size by deforming the deformable material to change at least one of the parameters of the path defined by the deformable aperture, and causing the particle or radiation to be detected, measured or controlled to enter the deformable aperture. The method includes the step of monitoring the geometry and/or size of the deformable aperture and controlling the adjustment of the size of the deformable aperture in response to such monitoring. The required apparatus is easily fabricated from inexpensive materials. Furthermore the deformable aperture can be tuned to the appropriate geometry post fabrication, and the ability to adjust the aperture geometry renders it capable of discriminating a plurality of differently sized particles.

1 . A method of detecting, measuring or controlling particles and/or electromagnetic radiation, the method comprising:
 providing a deformable material containing a deformable aperture defining a path for particles or radiation;   adjusting the deformable aperture by deforming the deformable material to change at least one of the parameters of the path defined by the deformable aperture; and causing the particle or radiation to be detected, measured or controlled to enter the deformable aperture.   
     
     
         2 . A method according to  claim 1 , further including the step of monitoring the geometry and/or size of the deformable aperture and controlling the adjustment of the geometry and/or size of the deformable aperture in response to such monitoring. 
     
     
         3 . A method according to  claim 1 , wherein the step of causing the particle or radiation to enter the deformable aperture makes use of Brownian motion, diffusion, pneumatic pressure, hydraulic pressure, osmotic pressure, electroosmosis, electrophoresis or induction within an electric field, within a magnetic field, by gravity, by the strong nuclear force, by the weak nuclear force or by radioactive decay. 
     
     
         4 . A method according to  claim 1 , for counting particles, wherein each particle entering the deformable aperture is detected and an incremental count is maintained of the number of particles detected. 
     
     
         5 . A method according to  claim 1 , for characterizing particles, wherein the time required for the particle to traverse the deformable aperture and/or changes in the sensing of the particle and/or changes in measured parameters of the deformable elastomeric material and/or the deformable aperture provide information about the structure of the particle. 
     
     
         6 . A method according to  claim 1 , for clamping particles, wherein the particle is clamped by closure of the deformable aperture on the particle in response to a change in the geometry and/or size of the deformable aperture. 
     
     
         7 . A method according to  claim 1 , for gating particles, wherein the flux of the particle is changed by adjusting the geometry of the deformable aperture. 
     
     
         8 . A method according to  claim 1 , wherein adjustment of the deformable aperture is controlled by applying a control signal indicative of a monitored parameter of the deformable aperture set to a pre-defined set-point according to a predefined algorithm to maintain the monitored parameter at the predefined set-point. 
     
     
         9 . A method according to  claim 1 , wherein adjustment of the deformable aperture is controlled by setting at least one parameter of the deformable aperture according to a predefined algorithm. 
     
     
         10 . A method according to  claim 1 , wherein adjustment of the deformable aperture is controlled according to the flux of particles traversing the deformable aperture, the flux of ionic particles in solution traversing the deformable aperture, the flux of electrical current traversing the deformable aperture, the flux of electrical tunneling current traversing the deformable aperture or the flux of electromagnetic radiation traversing the deformable aperture. 
     
     
         11 . A method according to  claim 1 , wherein the particle is in an ionic solution extending continuously through the deformable aperture such that the particle interferes with the flow of ionic current through the deformable aperture, and the ionic current is monitored to sense, monitor or control the passage of the particle. 
     
     
         12 . A method according to  claim 1 , wherein the direction and rate of passage of the particle through the deformable aperture is controlled by a potential difference applied across the deformable aperture. 
     
     
         13 . A method according to  claim 1 , which comprises
 adjusting the deformable aperture to the desired geometry and/or size;   establishing an ionic current of desired size and polarity through the deformable aperture; and   detecting the presence of the particle traversing the deformable aperture by means of a change in the monitored ionic current.   
     
     
         14 . A method according to  claim 1 , which comprises
 adjusting the deformable aperture to the desired initial geometry and/or size;   establishing a set-point ionic current through the deformable aperture;   adjusting the deformable aperture in response to the monitored ionic current as the deformable aperture is partially or fully occluded by the particle; and   detecting the presence of the particle traversing the deformable aperture by monitoring a change in the geometry and/or size of the deformable aperture.   
     
     
         15 . A method according to  claim 1 , for characterizing the particle, which comprises
 adjusting the deformable aperture to the desired geometry and/or size;   establishing an ionic current of desired size and polarity through the deformable aperture; and   characterizing the particle traversing the deformable aperture by means of a change in the monitored ionic current.   
     
     
         16 . A method according to  claim 1 , for characterizing the particle, which comprises
 adjusting the deformable aperture to the desired initial geometry and/or size;   establishing a set-point ionic current of desired size and polarity through the deformable aperture;   adjusting the geometry and/or size of the deformable aperture to maintain the monitored ionic current at the desired set-point current as the deformable aperture is partially or fully occluded by the particle; and   characterizing the particle traversing the deformable aperture by monitoring a change in the geometry and/or size of the deformable aperture.   
     
     
         17 . A method according to  claim 1 , for clamping the particle, which comprises
 adjusting the deformable aperture to the desired initial geometry and/or size;   establishing an ionic current of desired size and polarity through the deformable aperture;   detecting the presence of the particle traversing the deformable aperture by means of a change in the ionic current; and   adjusting the geometry and/or size of the deformable aperture and/or the size and/or polarity of the ionic current through the deformable aperture so as to effect closure of the deformable aperture on the particle to clamp the particle.   
     
     
         18 . A method according to  claim 1 , for clamping the particle, which comprises
 adjusting the deformable aperture to the desired initial geometry and/or size;   establishing an ionic current of desired size and polarity through the deformable aperture;   detecting the presence of the particle traversing the deformable aperture by means of a change in the ionic current;   adjusting the geometry and/or size of the deformable aperture to maintain the monitored ionic current at the desired set-point current as the deformable aperture is partially or fully occluded by the particle; and   adjusting the geometry and/or size of the deformable aperture and/or the size and/or polarity of the ionic current through the deformable aperture so as to effect closure of the deformable aperture on the particle to clamp the particle.   
     
     
         19 . A method according to  claim 1 , for changing the flux of the particle, which comprises
 adjusting the deformable aperture to the desired initial geometry and/or size;   establishing an ionic current of desired size and polarity through the deformable aperture;   detecting the presence of the particle traversing the deformable aperture by means of a change in the ionic current; and   adjusting the geometry and/or size of the deformable aperture and/or the size and/or polarity of the ionic current through the deformable aperture so as to control the flux of the particle through the deformable aperture.   
     
     
         20 . A method according to  claim 1 , for changing the flux of the particle, which comprises
 adjusting the deformable aperture to the desired initial geometry and/or size;   establishing an ionic electric current of desired size and polarity through the deformable aperture;   detecting the presence of the particle traversing the deformable aperture by means of a change in the ionic current;   adjusting the geometry and/or size of the deformable aperture to maintain the monitored ionic current at a desired set-point current as the deformable aperture is partially or fully occluded by the particle; and   adjusting the geometry and/or size of the deformable aperture and/or the size and/or polarity of the ionic current through the deformable aperture so as to control the flux of the particle through the deformable aperture.   
     
     
         21 . A method according to  claim 1 , further comprising monitoring at least one of the parameters of the path provided by the deformable aperture and providing feedback indicative of the monitored parameter. 
     
     
         22 . A method according to  claim 1 , further comprising providing the deformable elastomeric material as a sheet, wherein the sheet is perforated to provide the deformable aperture. 
     
     
         23 . A method according to  claim 1 , further comprising providing the deformable elastomeric material as a sheet and wherein deforming the deformable elastomeric material comprises deforming the sheet in one or more directions parallel to a plane of the sheet. 
     
     
         24 . A method according to  claim 1 , further comprising providing the deformable elastomeric material as a sheet having two main surfaces, and wherein the path for particles extends through the sheet from one of said surfaces to the other one of said surfaces.