US2013049186A1PendingUtilityA1
Semiconductor device and method of manufacture thereof
Est. expiryAug 26, 2031(~5.1 yrs left)· nominal 20-yr term from priority
H10W 74/00H10W 72/07327H10W 72/01308H10W 72/387H10W 72/367H10W 72/365H10W 72/354H10W 72/337H10W 72/332H10W 72/073H10W 72/30H10W 40/10H10W 40/00H10D 62/117Y10T156/10
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Claims
Abstract
A semiconductor device includes a semiconductor module having a heat conductive portion formed of metal and also having a molded resin having a surface at which the heat conductive portion is exposed, a cooling body secured to the semiconductor module by means of bonding material, and heat conductive material formed between and thermally coupling the heat conductive portion and the cooling body.
Claims
exact text as granted — not AI-modified1 . A semiconductor device comprising:
a semiconductor module having a heat conductive portion formed of metal and also having a molded resin having a surface at which said heat conductive portion is exposed; a cooling body secured to said semiconductor module by means of bonding material; and heat conductive material formed between and thermally coupling said heat conductive portion and said cooling body.
2 . The semiconductor device according to claim 1 , wherein:
said semiconductor module includes a semiconductor element encapsulated with said molded resin; said bonding material is formed of insulating material; said bonding material is formed to separate said heat conductive portion and said heat conductive material from the outside; and said heat conductive portion is insulated from said semiconductor element.
3 . The semiconductor device according to claim 1 , wherein:
said cooling body has a cooling body groove formed therein; and said heat conductive material is separated from said bonding material by said cooling body groove.
4 . The semiconductor device according to claim 1 , wherein said bonding material is formed to extend to cover a side surface of said molded resin.
5 . The semiconductor device according to claim 1 , wherein:
said molded resin has a resin groove formed in a surface thereof facing said cooling body; and said bonding material is formed to fill said resin groove.
6 . The semiconductor device according to claim 1 , wherein:
said bonding material is in contact with said molded resin; and the surface of said molded resin in contact with said bonding material has a greater surface roughness than the surfaces of said molded resin which are not in contact with said bonding material.
7 . The semiconductor device according to claim 1 , wherein:
said bonding material is in contact with said molded resin; and the portion of said molded resin in contact with said bonding material is more hydrophilic than the portions of said molded resin which are not in contact with said bonding material.
8 . The semiconductor device according to claim 1 , wherein said heat conductive material is formed of electrically conductive material.
9 . The semiconductor device according to claim 1 , wherein said heat conductive material is formed of silicone grease.
10 . A method of manufacturing a semiconductor device, comprising the steps of:
forming heat conductive material on a surface of a cooling body; forming bonding material on said surface of said cooling body, said bonding material having a projection; forming a resin groove in a molded resin of a semiconductor module having a heat conductive portion which is formed of metal and which is exposed at a surface of said molded resin; and integrally securing said cooling body and said semiconductor module together in such a manner that said projection is in contact with an inner wall of said resin groove, and that said heat conductive portion overlaps and is in contact with said heat conductive material.Join the waitlist — get patent alerts
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