Semiconductor-based detection and decontamination system

Abstract

A system for identifying and making quantitative determinations with respect to deposits on a portion of the system, determining that the deposit is a contaminant, and decontaminating at least the portion of the system is described. The system uses an embedded controller. It further includes an embedded sensing portion monitoring an atmosphere above the sensing portion. The sensing portion communicates with at least said controller and detects a quantity of the deposits. The sensing portion can be a film layer on a surface. The system also includes an embedded self-decontaminating portion.

The embodiment of the invention in which an exclusive property or privilege is claimed is defined as follows: 
     
         1 . A system for identifying and making quantitative determinations with respect to deposits on a portion of the system, determining that the deposit is a contaminant, and decontaminating at least the portion of the system, the system comprising:
 a) an embedded controller;   b) an embedded sensing portion monitoring an atmosphere above said sensing portion, the sensing portion communicating with at least said controller and to detect a quantity of the deposits, the sensing portion comprising a film layer on a surface; and   c) an embedded self-decontaminating portion triggered by the sensing portion and communicating with at least said controller to determine the resistance and temperature of the surface and which decontaminates the contaminated portion of the system wherein the sensing portion and the self-decontaminating portion are substantially encapsulated within the surface; wherein said embedded controller, said embedded sensing portion; and said self-decontaminating portion are integrally molded on said surface.   
     
     
         2 . The system as recited in  claim 1  wherein said controller further comprises a signature library storing data of at least one of a resistance and temperature of at least one non-contaminant. 
     
     
         3 . The system as recited in  claim 1  wherein said sensing and decontaminating portions are coupled to said controller using at least one connection. 
     
     
         4 . The system as recited in  claim 2  wherein said sensing portion comprises at least one electrode which measures at least one of resistance and temperature of the deposit. 
     
     
         5 . The system as recited in  claim 4  wherein said controller compares said measured at least one resistance and temperature with said stored at least one resistance and temperature to determine if the deposit is a contaminant. 
     
     
         6 . The system as recited in  claim 1  wherein said decontamination portion comprises at least one optic source which provides light having energy greater than the bandgap energy of a semiconductor comprising the layer, thereby decontaminating at least the portion of the system. 
     
     
         7 . The system as recited in  claim 1  wherein at least a portion of the system is coated with a semiconductor material. 
     
     
         8 . The system as recited in  claim 7  wherein said decontamination portion comprises at least one optic which provides light having energy equal to or exceeding said semiconductor's bandgap energy to decontaminate the portion of the system. 
     
     
         9 . The system as recited in  claim 7  wherein said semiconductor comprises a compound selected from the group consisting of TiO 2 , SrTiO 3 , ZnO, SrO, In 2 O 3 , GeO 2 , Nb 2 O 5 , MoO 3 , CeO 2 , ThO 2 , SnO 2 , ZrO 2 , VO 2 , WO 3 , CdS, and Fe 2 O 3 . 
     
     
         10 . The system as recited in  claim 7  wherein said sensing portion measures a resistance and temperature of said semiconductor. 
     
     
         11 . The system as recited in  claim 1  wherein said controller activates or deactivates the sensor portion and the decontamination portion. 
     
     
         12 . The system as recited in  claim 1  wherein the sensing portion is exposed to an atmosphere containing organic contaminants wherein the controller contains at least one of a resistance and temperature of said at least organic contaminants. 
     
     
         13 . The system as recited in  claim 1  wherein the decontamination process continues on a feedback loop until said contaminant is decontaminated from the surface.