US2013130417A1PendingUtilityA1

Manufacturing method of a light-emitting device

Assignee: WU JAR-YUPriority: Nov 22, 2011Filed: Nov 22, 2011Published: May 23, 2013
Est. expiryNov 22, 2031(~5.3 yrs left)· nominal 20-yr term from priority
H10H 20/835H10H 20/819H10H 20/0133H10H 20/032H10H 20/01H10H 20/8312B32B 27/32B32B 5/26B32B 2307/3065B32B 2437/00A41D 31/085B32B 27/34B32B 2571/02A41D 31/08B32B 27/36B32B 2262/0253B32B 2262/0276A62B 17/00B32B 2262/0261
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Claims

Abstract

A method for manufacturing a light-emitting device includes steps of: providing a substrate comprising an upper surface and a lower surface opposite to the upper surface; processing the upper surface to be an uneven surface; forming a light-emitting structure on the upper surface of the substrate; and forming a hole through the substrate by radiating a coherent laser beam to the lower surface of the substrate for a predetermined time; wherein the band gap energy of the coherent laser beam is higher than the band gap energy of the substrate thereby the substrate is etched away by the laser beam.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . A method for manufacturing a light-emitting device comprising steps of:
 providing a substrate comprising an upper surface and a lower surface opposite to the upper surface;   processing the upper surface to be an uneven surface;   forming a light-emitting structure on the upper surface of the substrate; and   forming a hole through the substrate by radiating a first coherent laser beam to the lower surface of the substrate for a predetermined time;   wherein the band gap energy of the coherent laser beam is higher than the band gap energy of the substrate thereby a portion of the substrate is etched away by the first coherent laser beam.   
     
     
         2 . The method according to  claim 1 , further comprising forming a conductive structure in the hole and electrically connected to the light-emitting structure, and forming a first contact on the lower surface of the substrate and electrically connected to the conductive structure after forming the hole. 
     
     
         3 . The method according to  claim 1 , wherein a part of the first coherent laser beam becomes a non-coherent laser light during the predetermined time by being deflected from the direction of the first coherent laser beam. 
     
     
         4 . The method according to  claim 1 , further comprising detecting the intensity of the non-coherent laser light by a photo-detector. 
     
     
         5 . The method according to  claim 4 , further comprising stopping radiating the first coherent laser beam when the intensity of the non-coherent laser light is detected. 
     
     
         6 . The method according to  claim 5 , wherein the intensity of the non-coherent laser light is detected when the first coherent laser beam reaches the uneven surface. 
     
     
         7 . The method according to  claim 1 , wherein the uneven surface comprises a periodic pattern having plurality of pattern units having a pitch. 
     
     
         8 . The method according to  claim 7 , wherein the pitch is the same as the wavelength of the coherent laser beam. 
     
     
         9 . The method according to  claim 7 , wherein the pitch is smaller than the wavelength of the coherent laser beam. 
     
     
         10 . The method according to  claim 7 , wherein the distance between two adjacent pattern units is smaller than the wavelength of the laser beam. 
     
     
         11 . The method according to  claim 5 , further comprising cleaning the hole by a second coherent laser beam after stopping radiating the coherent laser beam. 
     
     
         12 . The method according to  claim 1 , wherein the step of forming the light-emitting structure comprising steps of forming a buffer layer on the uneven surface of the substrate, forming a first semiconductor layer on the buffer layer, forming an active layer on the first semiconductor layer, and forming a second semiconductor layer on the active layer. 
     
     
         13 . The method according to  claim 1 , further comprising forming a reflective layer on the lower surface of the substrate. 
     
     
         14 . The method according to  claim 1 , wherein the method is performed in an MOCVD chamber.

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