US2013154074A1PendingUtilityA1
Semiconductor stack packages and methods of fabricating the same
Est. expiryDec 14, 2031(~5.4 yrs left)· nominal 20-yr term from priority
Inventors:Tac Keun Oh
H10W 90/734H10W 90/732H10W 90/724H10W 90/722H10W 90/297H10W 90/22H10W 74/142H10W 74/15H10W 74/00H10W 72/07254H10W 72/07232H10W 72/944H10W 72/942H10W 72/823H10W 72/351H10W 72/252H10W 72/247H10W 72/244H10W 72/242H10W 72/241H10W 72/221H10W 72/0198H10W 72/072H10W 72/29H10W 74/121H10W 74/014H10W 72/00H10W 90/00H10W 70/60
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Claims
Abstract
Semiconductor chip stacks are provided. The semiconductor chip stack includes a semiconductor chip stack including a plurality of first semiconductor chips vertically stacked on a top surface of the interposer, a second semiconductor chip stacked on a bottom surface of the interposer opposite to the semiconductor chip stack, and an external electrode attached to a top surface of the second semiconductor chip opposite to the interposer. Electronic systems including the semiconductor chip stack and related methods are also provided.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A semiconductor stack package, comprising:
an interposer; a semiconductor chip stack including a plurality of first semiconductor chips vertically stacked on a top surface of the interposer; a second semiconductor chip stacked on a bottom surface of the interposer opposite to the semiconductor chip stack; and an external electrode attached to a top surface of the second semiconductor chip opposite to the interposer.
2 . The semiconductor stack package of claim 1 , further comprising:
a first through electrode penetrating the interposer; a second through electrode that penetrates the first semiconductor chips to electrically connect the first semiconductor chips to the first through electrode; and a third through electrode that penetrates the second semiconductor chip to electrically connect the first through electrode to the external electrode.
3 . A semiconductor stack package, comprising:
an interposer in which a first through electrode is inserted; a semiconductor chip stack including a plurality of first semiconductor chips vertically stacked on a top surface of the interposer; a second through electrode that penetrates the semiconductor chip stack to be electrically connected to the first through electrode; a second semiconductor chip on a bottom surface of the interposer; and a third through electrode that penetrates the second semiconductor chip to be electrically connected to the first through electrode.
4 . The semiconductor stack package of claim 3 , further comprising a protection layer covering the semiconductor chip stack.
5 . The semiconductor stack package of claim 3 , wherein each of the plurality of first semiconductor chips includes a memory chip.
6 . The semiconductor stack package of claim 3 , wherein the second semiconductor chip includes a logic chip.
7 . The semiconductor stack package of claim 3 , further comprising a protection layer covering the second semiconductor chip.
8 . The semiconductor stack package of claim 7 , wherein the protection layer covers sidewalls of the second semiconductor chip and to expose a top surface of the second semiconductor chip opposite to the interposer.
9 . The semiconductor stack package of claim 3 , further comprising an external electrode electrically connected to the third through electrode.
10 . A method of fabricating a semiconductor stack package, the method comprising:
vertically stacking a plurality of first semiconductor chips on a top surface of an interposer to form a semiconductor chip stack; and stacking a second semiconductor chip on a bottom surface of the interposer opposite to the semiconductor chip stack.
11 . The method of claim 10 , further comprising:
forming a first through electrode that penetrates a body of the interposer, wherein one end of the first through electrode is exposed at the top surface of the interposer to constitute a first contact portion, and an other end of the first through electrode is exposed at the bottom surface of the interposer to constitute a second contact portion.
12 . The method of claim 11 , wherein the semiconductor chip stack is formed to include a second through electrode that penetrates the plurality of first semiconductor chips to electrically connect the first semiconductor chips to each other, and the second through electrode is electrically connected to the first through electrode.
13 . The method of claim 11 , wherein the second semiconductor chip is formed to include a second through electrode that penetrates a body of the second semiconductor chip, and the second through electrode is electrically connected to the first through electrode.
14 . The method of claim 13 , further comprising attaching an external electrode to the second through electrode.
15 . The method of claim 10 , wherein the interposer is a substrate including silicon material.Join the waitlist — get patent alerts
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