US2013175546A1PendingUtilityA1
Diamond Semiconductor System and Method
Est. expiryJan 6, 2032(~5.5 yrs left)· nominal 20-yr term from priority
Inventors:Adam Khan
H10P 14/3441H10P 70/52H10P 50/242H10P 14/3442H10P 14/3406H10P 14/3238H10P 14/3206H10P 14/2905H10P 14/2901H10P 14/24H10D 64/0114H10P 30/2044H10D 62/882H10D 30/472H10D 62/8303H10D 62/10H10D 30/60H10D 30/01H10D 8/051H10D 8/50H10H 20/01H10H 20/826H10F 77/122H10P 30/21H10P 30/208H10P 30/28H10P 30/222H10P 30/22Y02E10/547H01L 21/2053H01L 29/1602
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Claims
Abstract
Disclosed herein is a new and improved system and method for fabricating monolithically integrated diamond semiconductor. The method may include the steps of seeding the surface of a substrate material, forming a diamond layer upon the surface of the substrate material; and forming a semiconductor layer within the diamond layer, wherein the diamond semiconductor of the semiconductor layer has n-type donor atoms and a diamond lattice, wherein at least 0.16% of the donor atoms contribute conduction electrons with mobility greater than 770 cm 2 /Vs to the diamond lattice at 100 kPa and 300K.
Claims
exact text as granted — not AI-modified1 . A method of fabricating a monolithically integrated diamond semiconductor, the method including the steps of:
seeding the surface of a substrate material; forming a diamond layer upon the surface of the substrate material; and forming a semiconductor layer within the diamond layer, wherein the diamond semiconductor of the semiconductor layer has n-type donor atoms and a diamond lattice, wherein at least 0.16% of the donor atoms contribute conduction electrons with mobility greater than 770 cm 2 /Vs to the diamond lattice at 100 kPa and 300K.
2 . The method of fabricating a monolithically integrated diamond semiconductor of claim 1 , wherein the substrate material is selected from the group consisting of silicon, silicon oxide, refractory metal, glass, and wide band gap semiconductor material.
3 . The method of fabricating a monolithically integrated diamond semiconductor of claim 1 , wherein the diamond layer is formed using chemical vapor deposition.
4 . The method of fabricating a monolithically integrated diamond semiconductor of claim 1 , wherein the diamond layer is formed at or below 450 degrees Celsius.
5 . A monolithically integrated diamond semiconductor device formed according to the method of claim 1 .
6 . The monolithically integrated diamond semiconductor device of claim 5 , wherein the device is one of a group consisting of an LED, an attenuator, an amplifier, a switch, and a sensor.
7 . The monolithically integrated diamond semiconductor device of claim 5 , wherein the device includes logic elements.
8 . The monolithically integrated diamond semiconductor device of claim 7 , wherein the device is one of a group consisting of a transistor and a diode.
9 . (canceled)Cited by (0)
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