Imaging pixels and related methods

Abstract

An improved CMOS pixel with a combination of analog and digital readouts to provide a large pixel dynamic range without compromising low-light performance using a comparator to test the value of an accumulated charge at a series of exponentially increasing exposure times. The rest is used to stop the integration of photocurrent once the accumulated analog voltage has reached a predetermined threshold. A one-bit output value of the test is read out of the pixel (digitally) at each of the exponentially increasing exposure periods. At the end of the integration period, the analog value stored on the integration capacitor is read out using conventional CMOS active pixel readout circuits.

1 . A method comprising:
 generating a photocurrent representative of radiation incident on a photodetector of a pixel during a time period;   accumulating on a capacitor a charge at least partially from the photocurrent;   producing a first output signal of the pixel representing the charge accumulated on the capacitor; and   producing a second output signal of the pixel indicative of an amount of time required for the charge accumulated on the capacitor to reach a reference level, wherein the second output signal is produced using an RS flip-flop circuit.   
     
     
         2 . The method of  claim 1 , wherein the first output signal is an analog signal. 
     
     
         3 . The method of  claim 2 , wherein the second output signal is a digital signal. 
     
     
         4 . The method of  claim 3 , further comprising modifying the first output signal at an end of the time period using the second output signal to produce a resulting signal representing an amount of the radiation incident on the photodetector. 
     
     
         5 . The method of  claim 4 , wherein producing the second output signal comprises comparing, at one or more times during the time period, the charge accumulated on the capacitor to the reference level; and
 (a) responsive to the charge accumulated on the capacitor being less than the reference level, generating a first digital value; and   (b) responsive to the charge accumulated on the capacitor exceeding the reference level, generating a second digital value.   
     
     
         6 . The method of  claim 5 , further comprising, responsive to the charge accumulated on the capacitor exceeding the reference level, holding the first output signal at a current level. 
     
     
         7 . The method of  claim 6 , wherein holding the first output signal at a current level comprises disconnecting the capacitor from the photodetector to stop accumulating charge on the capacitor from the photocurrent. 
     
     
         8 . The method of  claim 7 , wherein the digital signal is a one-bit digital signal. 
     
     
         9 . The method of  claim 7 , wherein modifying the first output signal at the end of the time period using the second output signal comprises generating an exponent qualifying the first output signal at the end of the time period using the second output signal. 
     
     
         10 . The method of  claim 7 , wherein the second output signal comprises a sequence of digital values produced by the comparison, at the one or more times during the time period, of the charge accumulated on the capacitor to the reference level, each digital value of the sequence of digital values having a position within the sequence identifying at which time of the one or more times during the time period the digital value was produced.