Environmental test system and method with in-situ temperature sensing of device under test (dut)

Abstract

An environmental chamber system and a method for testing a device under test (DUT) include an environmental chamber in which the DUT can be tested. A temperature sensor senses temperature of the DUT, the temperature sensor generating a signal indicative of temperature of the DUT. A controller receives at least one input signal related to at least one of temperature and humidity in the chamber and the signal indicative of temperature of the DUT and provides at least one control signal for adjusting at least one of temperature and humidity in the chamber, such that the temperature of the DUT is not below a dew point of an environment in the chamber in a region of the chamber near the DUT, such that condensation in the environment in the chamber in the region near the DUT does not occur.

1 . An environmental chamber system in which a device under test (DUT) can be tested, the environmental chamber system comprising:
 an environmental chamber in which the DUT can be tested;   a temperature sensor for sensing temperature of the DUT, the temperature sensor generating a signal indicative of temperature of the DUT; and   a controller for receiving at least one input signal related to at least one of temperature and humidity in the chamber and receiving the signal indicative of temperature of the DUT and providing at least one control signal for adjusting at least one of temperature and humidity in the chamber, such that the temperature of the DUT is not below a dew point of an environment in the chamber in a region of the chamber near the DUT, such that condensation in the environment in the chamber in the region near the DUT does not occur.   
     
     
         2 . The system of  claim 1 , wherein the controller comprises a mathematical filter. 
     
     
         3 . The system of  claim 1 , wherein the at least one input signal comprises two input signals, the two input signals being indicative of humidity and temperature in the chamber. 
     
     
         4 . The system of  claim 1 , wherein the at least one control signal adjusts heating in the chamber. 
     
     
         5 . The system of  claim 1 , wherein the at least one control signal adjusts cooling in the chamber. 
     
     
         6 . The system of  claim 1 , wherein the at least one control signal is generated to remove moisture from the chamber. 
     
     
         7 . The system of  claim 1 , wherein the at least one control signal is generated to add moisture to the chamber. 
     
     
         8 . The system of  claim 1 , wherein the temperature sensor contacts the DUT inside the chamber. 
     
     
         9 . The system of  claim 1 , wherein the temperature sensor is an infrared temperature sensor, and the DUT is within a field of view of the infrared sensor. 
     
     
         10 . The system of  claim 9 , wherein the infrared sensor is inside the chamber. 
     
     
         11 . The system of  claim 9 , wherein the infrared sensor is outside the chamber. 
     
     
         12 . A method of testing a device under test (DUT), comprising:
 placing the DUT in an environmental chamber;   sensing temperature of the DUT with a temperature sensor, the temperature sensor generating a first signal, the first signal being indicative of temperature of the DUT;   sensing at least one of temperature and humidity inside the chamber and generating at least one second signal indicative of the at least one of temperature and humidity inside the chamber; and   generating at least one control signal for adjusting at least one of temperature and humidity in the chamber, such that the temperature of the DUT is not below a dew point of an environment in the chamber in a region of the chamber near the DUT, such that condensation in the environment in the chamber in the region near the DUT does not occur, the at least one control signal being based on first signal and the at least one second signal.   
     
     
         13 . The method of  claim 12 , wherein the at least one second signal comprises two signals, the two signals being indicative of humidity and temperature in the chamber. 
     
     
         14 . The method of  claim 12 , wherein the at least one control signal adjusts heating in the chamber. 
     
     
         15 . The method of  claim 12 , wherein the at least one control signal adjusts cooling in the chamber. 
     
     
         16 . The method of  claim 12 , wherein the at least one control signal is generated to remove moisture from the chamber. 
     
     
         17 . The method of  claim 12 , wherein the at least one control signal is generated to add moisture to the chamber. 
     
     
         18 . The method of  claim 12 , wherein the temperature sensor contacts the DUT inside the chamber. 
     
     
         19 . The method of  claim 12 , wherein the temperature sensor is an infrared temperature sensor, and the DUT is within a field of view of the infrared sensor. 
     
     
         20 . The method of  claim 19 , wherein the infrared sensor is inside the chamber. 
     
     
         21 . The method of  claim 19 , wherein the infrared sensor is outside the chamber.