Method and system for testing oscillator circuit

Abstract

An oscillator circuit generates a voltage signal. The magnitude of the voltage signal is measured and compared with predetermined upper and lower voltage signals by an internal test circuit. If the magnitude of the voltage signal is between the predetermined upper and lower voltage signals, then a pass test status signal is generated. If the magnitude of the voltage signal is not between the predetermined upper and lower voltage signals then a fail test status signal is generated.

1 . (canceled) 
     
     
         2 . A system for testing an oscillator circuit, comprising:
 an inverter connected between an input terminal and an output terminal of the oscillator circuit, the inverter being configured to operate based on a DC bias point voltage;   a first switch connected in parallel to the inverter;   a second switch connected in series with the first switch; and   an internal test circuit that generates a test status signal by comparing a magnitude of the DC bias point voltage with first and second voltage levels, wherein the internal test circuit measures the magnitude of the DC bias point voltage based on a state of the first switch and a state of the second switch.   
     
     
         3 . The system of the  claim 2 , wherein both the first switch and the second switch are switched to at least one of an ON state and an OFF state at same time. 
     
     
         4 . The system of the  claim 2 , wherein the internal test circuit measures the magnitude of the DC bias point state voltage when the first switch and the second switch are in an ON state. 
     
     
         5 . The system of the  claim 2 , wherein the internal test circuit includes a comparator for comparing the DC bias point voltage with the first and second voltage levels to generate the test status signal, wherein the test status signal signifies at least one of a pass status and a fail status of the oscillator circuit. 
     
     
         6 . The system of  claim 5 , wherein the internal test circuit is an ADC (Analog to Digital Converter). 
     
     
         7 . The system of  claim 2 , wherein the inverter is an amplifier. 
     
     
         8 . The system of  claim 7 , wherein the amplifier is a class A amplifier. 
     
     
         9 - 16 . (canceled)