US2014206126A1PendingUtilityA1
Methods of growing heteroepitaxial single crystal or large grained semiconductor films on glass substrates and devices thereon
Est. expiryMay 28, 2028(~1.9 yrs left)· nominal 20-yr term from priority
Inventors:Praveen Chaudhari
H10P 14/3462H10P 14/3458H10P 14/3456H10P 14/3431H10P 14/3428H10P 14/3421H10P 14/3411H10P 14/3238H10P 14/3202H10P 14/2923H10P 14/2922H10P 14/279H10P 14/274H10P 14/263H10P 14/26H10P 14/24H10F 77/707H10F 77/703H10F 77/30H10F 71/00H10F 19/20H10F 10/161H10F 10/142H10F 71/121Y02P70/50C30B 25/02C30B 23/025C30B 29/06Y02E10/544Y02E10/547C30B 11/12C30B 25/183H01L 21/02422H01L 21/02557H01L 21/02546H01L 21/02623H01L 21/02425H01L 21/0262H01L 21/02532
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Claims
Abstract
A method is disclosed for making semiconductor films from a eutectic alloy comprising a metal and a semiconductor. Through heterogeneous nucleation said film is deposited at a deposition temperature on relatively inexpensive buffered substrates, such as glass. Specifically said film is vapor deposited at a fixed temperature in said deposition temperature where said deposition temperature is above a eutectic temperature of said eutectic alloy and below a temperature at which the substrate softens. Such films could have widespread application in photovoltaic and display technologies.
Claims
exact text as granted — not AI-modified1 - 13 . (canceled)
14 . A method of making a Vapor-Liquid-Solid (VLS) thin-film semiconductor device, comprising the steps of: providing a substrate, and vapor depositing a semiconductor film onto said substrate, said semiconductor film being deposited out of a eutectic liquid, said liquid comprising a solid and liquid eutectic alloy, said solid part deposited onto said substrate.
15 . The method of claim 16 , wherein said substrate is glass.
16 . The method of claim 16 , wherein said substrate is a metal tape.
17 . The method of claim 16 , wherein said semiconductor device is a photovoltaic cell.
18 . The method of claim 16 , wherein said semiconductor device is a Field-Effect-Transistor (FET).
19 . The method of claim 1 , wherein said semiconductor film is etched.
20 . The method of claim 21 , wherein said etched film is used as the surface on which thicker film can be deposited.
21 . The method of claim 16 , wherein said substrate is buffered with MgO, crystalline Al 2 03, or TiN.
22 . The method of claim 16 , wherein said semiconductor is comprised of Si, Ge, GaAs, CdS.
23 . The method of claim 16 , wherein said eutectic liquid is comprised in part by Au, Al, Ag, Sn, In.
24 . The method of claim 16 , where said substrate is buffered with MgO, crystalline Al203, or TiN.
25 . The method of claim 16 , where said semiconductor is comprised of Si, Ge, GaAs, CdS.
26 . The method of claim 16 , where said eutectic liquid is comprised in part by Au, Al, Ag, Sn, In.Cited by (0)
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