Cantilevered probes having piezoelectric layer, treated section, and resistive heater, and method of use for chemical detection
Abstract
The invention provides a liquid cell for an atomic force microscope. The liquid cell includes a liquid cell housing with an internal cavity to contain a fluid, a plurality of conductive feedthroughs traversing the liquid cell housing between the internal cavity and a dry side of the liquid cell, a cantilevered probe coupled to the liquid cell housing, and a piezoelectric drive element disposed on the cantilevered probe. The cantilevered probe is actuated when a drive voltage is applied to the piezoelectric drive element through at least one of the conductive feedthroughs. A method of imaging an object in a liquid medium and a method of sensing a target species with the liquid cell are also disclosed.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A chemical sensor system comprising:
a first cantilevered probe comprising:
a piezoelectric layer;
a treated section selected to react with a chemical species;
a resistive heater thermally couplable to the treated section; and
first and second electrodes electrically coupled to the piezoelectric layer;
a driver circuit electrically coupled to the first and second electrodes and configured to actuate the cantilevered probe; a sensing circuit electrically coupled to the first and second electrodes and configured to sense oscillation of the cantilevered probe; a heater circuit electrically coupled to the resistive heater; and a plurality of additional cantilevered probes arranged in an array together with the first cantilevered probe, each of the plurality of additional cantilevered probes comprising:
a piezoelectric layer; and
first and second electrodes electrically coupled to the piezoelectric layer;
wherein the first cantilevered probe is actuated when, through the first and second electrodes, a drive voltage is applied to the piezoelectric layer by the driver circuit, the actuated cantilevered probe generating a displacement signal transmitted to the sensing circuit, and wherein the piezoelectric layers of each of the cantilevered probes of the array are connected in parallel.
2 . The sensor system of claim 1 , wherein each of the plurality of additional cantilevered probes comprises a resistive heater; and
an electrical lead electrically coupled to the heater circuit and each of the resistive heaters of the plurality of additional cantilevered probes.
3 . The sensor system of claim 1 , wherein the resistive heater is formed as one piece with the cantilevered probe.
4 . The sensor system of claim 1 , further comprising a passivation layer disposed on the piezoelectric layer of the first cantilevered probe.
5 . The sensor system of claim 1 , wherein at least two of the array of cantilevered probes having a treated section different from one another.
6 . The sensor system of claim 1 , wherein at least one of the array of cantilevered probes having a treated section and at least one of the array of cantilevered probes not having a treated section.
7 . The sensor system of claim 1 , wherein at least one of the array of cantilevered probes having a temperature sensing element.
8 . A method of determining the composition of a sample comprising:
providing a first cantilevered probe and a plurality of additional cantilevered probes arranged in an array together with the first cantilevered probe,
the first cantilevered probe comprising:
a piezoelectric layer;
a resistive heater;
a treated section;
a first electrode electrically coupled to the piezoelectric layer; and
a second electrode electrically coupled to the piezoelectric layer; and
each of the plurality of additional cantilevered probes comprising:
a piezoelectric layer; and
first and second electrodes electrically coupled to the piezoelectric layer;
wherein the piezoelectric layers of each of the cantilevered probes of the array are connected in parallel;
driving the first cantilevered probe by applying an excitation voltage to the piezoelectric layer; sensing vibration of the first cantilevered probe by measuring a signal generated by the piezoelectric element; exposing the treated section to a sample; and after exposing the treated section to the sample, sensing vibration of the first cantilevered probe by measuring a signal generated by the piezoelectric element.
9 . The method of claim 8 wherein exposing the treated section to a sample comprises exposing the treated section to a liquid sample.
10 . The method of claim 8 further comprising heating at least one of the array of cantilevered probes and sensing the temperature of the heated array.
11 . A chemical sensor system comprising:
a first cantilevered probe comprising:
a piezoelectric layer;
a resistive heater thermally couplable to the surface of the first cantilevered probe; and
first and second electrodes electrically coupled to the piezoelectric layer;
a driver circuit electrically coupled to the first and second electrodes and configured to actuate the cantilevered probe; a sensing circuit electrically coupled to the first and second electrodes and configured to sense oscillation of the cantilevered probe; a heater circuit electrically coupled to the resistive heater; and a plurality of additional cantilevered probes arranged in an array together with the first cantilevered probe, each of the plurality of additional cantilevered probes comprising:
a piezoelectric layer; and
first and second electrodes electrically coupled to the piezoelectric layer;
wherein the first cantilevered probe is actuated when, through the first and second electrodes, a drive voltage is applied to the piezoelectric layer by the driver circuit, the actuated cantilevered probe generating a displacement signal transmitted to the sensing circuit, and wherein the piezoelectric layers of each of the cantilevered probes of the array are connected in parallel.
12 . The sensor system of claim 11 , wherein each of the plurality of additional cantilevered probes comprises a resistive heater; and
an electrical lead electrically coupled to the heater circuit and each of the resistive heaters of the plurality of additional cantilevered probes.
13 . The sensor system of claim 11 , further comprising a passivation layer disposed on the piezoelectric layer of the first cantilevered probe.
14 . The sensor system of claim 11 , wherein at least one of the array of cantilevered probes having a treated section and at least one of the array of cantilevered probes not having a treated section.
15 . The sensor system of claim 11 , wherein at least one of the array of cantilevered probes having an element capable of temperature sensing.
16 . The sensor system of claim 11 , wherein the first cantilevered probe further comprises a treated section selected to react with a chemical species.Cited by (0)
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