Method and system for performing x-ray inspection of a product at a security checkpoint using simulation

Abstract

A method, an apparatus and a system are provided for deriving a characteristic of a product using X-rays. X-ray image data derived by performing an X-ray scan of the product and conveying attenuation information is received. A response of a reference product to X-rays is then simulated to generate simulated X-ray image data. The simulated X-ray image data and the received X-ray image data are then processed to derive one or more characteristics of the product. In a specific implementation, the product is a liquid product comprised of a bottle at least partially filled with liquid and the derived characteristic is a threat status assessment associated with the liquid in the bottle. In another aspect, a simulation engine for simulating interactions between X-rays and objects is also provided.

1 .- 54 . (canceled) 
     
     
         55 . An apparatus for simulating a response of a reference product to X-rays, said apparatus comprising a processor for processing characterization data associated with the reference product to generate simulated X-ray image data associated with the reference product by modelling interactions between X-rays and the reference product, wherein the characterization data associated with the reference product was derived at least in part by processing X-ray image data obtained by scanning a product under inspection using an X-ray imaging apparatus. 
     
     
         56 . An apparatus as defined in  claim 55 , wherein the characterization data conveys:
 i) shape information associated with the reference product; and   ii) material type information associated with the reference product.   
     
     
         57 . An apparatus as defined in  claim 56 , wherein the characterization data conveys positioning information for positioning the reference product relative to a source of X-rays. 
     
     
         58 . An apparatus as defined in  claim 55 , wherein the characterization data associated with the reference product is derived at least in part based on geometric information associated with the product under inspection. 
     
     
         59 . An apparatus as defined in  claim 55 , wherein said apparatus comprises an input for receiving the characterization data associated with the reference product and wherein said processor is in communication with said input. 
     
     
         60 . An apparatus as defined in  claim 58 , wherein said processor implements a product characterisation module for:
 a) processing the X-ray image data obtained by scanning the product under inspection to derive the geometric information associated with the product under inspection;   b) deriving the characterization data associated with the reference product at least in part by processing the geometric information associated with the product under inspection.   
     
     
         61 . An apparatus as defined in  claim 60 , wherein said apparatus comprises an input for receiving the X-ray image data obtained by scanning the product under inspection for processing by the processor, said X-ray image data conveying attenuation information resulting from interaction of X-rays with the product under inspection. 
     
     
         62 . A method for deriving a characteristic of a product under inspection, said method comprising:
 a) processing characterization data associated with the product under inspection to generate simulated X-ray image data by modelling interactions between X-rays and the product under inspection, wherein the characterization data was derived at least in part by processing X-ray image data obtained by scanning the product under inspection using an X-ray imaging apparatus;   b) processing the simulated X-ray image data to derive the characteristic of the product under inspection;   c) releasing data conveying the derived characteristic of the product under inspection.   
     
     
         63 . A method as defined in  claim 62 , said method comprising receiving the characterization data associated with the product under inspection. 
     
     
         64 . A method as defined in  claim 62 , wherein the characterization data conveys:
 i) shape information associated with the product under inspection; and   ii) positioning information for positioning the product under inspection relative to a source of X-rays.   
     
     
         65 . A method as defined in  claim 62 , wherein the characteristic of the product under inspection is derived at least in part by comparing the X-ray image data obtained by scanning the product under inspection to the simulated X-ray image data. 
     
     
         66 . A method as defined in  claim 62 , wherein said method further comprises:
 a) processing the X-ray image data obtained by scanning the product under inspection to derive geometric information associated with the product under inspection;   b) deriving the characterization data at least in part by processing the geometric information associated with the product under inspection.   
     
     
         67 . A method as defined in  claim 66 , said method comprising receiving the X-ray image data obtained by scanning the product under inspection, said X-ray image data conveying attenuation information resulting from interaction of X-rays with the product under inspection. 
     
     
         68 . An apparatus for deriving a characteristic of a product under inspection, said apparatus comprising:
 a) an input for receiving characterization data associated with the product under inspection, wherein the characterization data was derived at least in part by processing X-ray image data obtained by scanning the product under inspection using an X-ray imaging apparatus;   b) a processing module in communication with said input, said processing module being programmed for:
 i) processing the received characterization data to generate simulated X-ray image data by modelling interactions between X-rays and the product under inspection; 
 ii) processing the simulated X-ray image data to derive the characteristic of the product under inspection; 
   c) an output for releasing data conveying the derived characteristic of the product under inspection.   
     
     
         69 . An apparatus as defined in  claim 68 , wherein the characterization data conveys:
 i) shape information associated with the product under inspection; and   ii) positioning information for positioning the product under inspection relative to a source of X-rays.   
     
     
         70 . An apparatus defined in  claim 68 , wherein processing the simulated X-ray image data to derive the characteristic of the product under inspection includes comparing the X-ray image data obtained by scanning the product under inspection to the simulated X-ray image data.