US2014349436A1PendingUtilityA1
Method for making a spacer in a photovoltaic substrate
Est. expiryJul 21, 2024(expired)· nominal 20-yr term from priority
Inventors:Paul Greiff
H10F 77/60H01L 31/024H01L 31/0406H02S 10/30Y02E10/50
71
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Claims
Abstract
A micron gap thermo-photo-voltaic device including a photovoltaic substrate, a heat source substrate, and a plurality of spacers separating the photovoltaic substrate from the heat source substrate by a submicron gap. Each spacer includes an elongated thin-walled structure disposed in a well formed in the heat source substrate and having a top surface less than a micron above the heat source substrate. Also disclosed are methods of making the spacers.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 - 9 . (canceled)
10 . A method of making a spacer separating a photovoltaic substrate from a heat source by a submicron gap, the method comprising:
forming a well in the heat source substrate; growing or depositing a thermally resistant material on the surface of the well; and enlarging the well to form an elongated thin-walled structure disposed in the well having a top surface less than a micron above the heat source substrate.
11 . The method of claim 10 in which the well is formed by photolithography processes and plasma etching.
12 . The method of claim 10 in which the well is greater than 15 microns deep and 15 microns wide.
13 . The method of claim 10 in which the thermally resistant material is silicon dioxide grown on the surface of the well.
14 . The method of claim 13 in which the silicon dioxide is grown to a thickness of greater than 0.5 microns.
15 . The method of claim 10 in which enlarging the well includes etching.
16 . The method of claim 15 in which etching includes an anisotropic etch.
17 . The method of claim 10 in which a recess is formed in the heat source substrate and the well is formed in the recess.
18 . The method of claim 17 in which the recess is formed by etching.
19 . The method of claim 17 in which the thermally resistant material is grown or deposited to a thickness greater than the depth of the recess.
20 . The method of claim 17 in which the thermally resistant material is patterned in the vicinity of the well to form a flange in the recess.
21 . The method of claim 10 in which the thermally resistant material is a dielectric deposited on the surfaces of the well.
22 . The method of claim 21 in which the dielectric is zirconia.
23 . The method of claim 21 further including the step of etching the surface of the heat source substrate so that the thermally resistant material extends above the surface of the heat source substrate.
24 - 29 . (canceled)
30 . A method of making a spacer separating a first substrate from a second substrate, the method comprising:
forming a well in one said substrate; growing or depositing a thermally resistant material on the surface of the well; and enlarging the well to form an elongated thin-walled structure disposed in the well having a top surface above said substrate.
31 . The method of claim 30 in which the first substrate is a photovoltaic substrate.
32 . The method of claim 30 in which the second substrate is a heat source substrate.
33 . The method of claim 32 in which the well is formed in the heat source substrate.
34 . The method of claim 17 in which the recess is formed by growth and dissolution of thermally grown oxide.
35 . A method of making a spacer separating a photovoltaic substrate from atop surface of a heat source by a submicron gap, the method comprising:
forming a well in the heat source substrate that extends from the top surface of the heat source substrate and extends into the body of the heat source substrate; growing or depositing a thermally resistant material on the surface of the well; and enlarging the well to form an elongated thin-walled structure disposed in the well having atop surface less than a micron above the top surface of the heat source substrate.
36 . The method of claim 34 wherein the heat source substrate is made of silicon, the spacer is made of silicon dioxide; and the well is greater than 15 microns deep and 15 microns wide.Join the waitlist — get patent alerts
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