US2015108219A1PendingUtilityA1
Machine-readable symbols
Est. expirySep 20, 2030(~4.2 yrs left)· nominal 20-yr term from priority
Inventors:Robert K. Rowe
G06K 19/06159G06K 19/06028G06K 19/06046G06K 7/12G06K 7/1413G06K 7/1417G06K 7/1478
58
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Claims
Abstract
A variety of forms of machine-readable symbols are disclosed, as well as methods and systems of constructing machine-readable symbols, methods and systems of acquiring machine-readable symbols, and methods and systems of decoding machine-readable symbols.
Claims
exact text as granted — not AI-modified1 .- 140 . (canceled)
141 . A machine-readable symbol, comprising:
a first machine-readable symbol instantiated on an object, said machine-readable symbol having a number of code elements that can be read by one or more methodologies to yield code values, said code elements constituting a basic unit of said symbol that yields said value independent of any other code element and free from decoding any other code value of said machine-readable symbol; said code elements comprising at least three non-binary code elements including a first code element having a first value, a second code element having a second value different than said first value, and a third code element having a third value different from said first and second values.
142 . A machine-readable symbol as set forth in claim 141 , wherein said code elements include four non-binary code elements having four different values.
143 . A machine-readable symbol as set forth in claim 141 , wherein each of said non-binary code elements are readable by a combination of two different methodologies.
144 . A machine-readable symbol as set forth in claim 143 , wherein each of said two different methodologies involves an optical characteristic.
145 . A machine-readable symbol as set forth in claim 143 , wherein said two different methodologies comprise a reflectance methodology and a topographic methodology.
146 . A machine-readable symbol as set forth in claim 145 , wherein said topographic methodology yields information concerning a depth of a code element under analysis.
147 . A machine-readable symbol as set forth in claim 145 , wherein said two different methodologies yield a quaternary symbol value set composed of first and second states of said first methodology and first and second states of said second methodology.
148 . A machine-readable symbol as set forth in claim 147 , wherein quaternary symbol value set includes values corresponding to white-surface, white-deep, black-surface, and black-deep.
149 . A machine-readable symbol as set forth in claim 141 , wherein the first machine-readable symbol comprises a barcode printed on the surface of the object.
150 . A machine-readable symbol as set forth in claim 141 , wherein the first machine-readable symbol comprises a barcode printed on a conformal layer applied over the surface of the object.
151 . A method for decoding a first machine-readable symbol, comprising the steps of:
acquiring an image of the machine-readable symbol; identifying an image portion of said image corresponding to an element of said machine-readable symbol; processing the identified image portion using one or more methodologies to determine a code value from a value set corresponding to the code element, said value set having at least three possible values.
152 . A method as set forth in claim 151 , wherein said value set includes at least four different values.
153 . A method as set forth in claim 151 , wherein said step of processing comprises:
processing the image to separately evaluate first and second characteristics of the image portion: applying a first methodology to obtain first information from the evaluated first characteristic; and applying a second methodology to obtain second information from the second evaluated characteristic; and using the first information and the second information to determine said code value from said set of code values.
154 . A method set forth in claim 153 , wherein each of said two different methodologies involves an optical characteristic.
155 . A method as set forth in claim 153 , wherein said two different methodologies comprise a reflectance methodology and a topographic methodology.
156 . A method as set forth in claim 155 , wherein said topographic methodology yields information concerning a depth of a code element under analysis.
157 . A method as set forth in claim 155 , wherein said two different methodologies yield a quaternary symbol value set composed of first and second states of said first methodology and first and second states of said second methodology.
158 . A method as set forth in claim 157 , wherein quaternary symbol value set includes values corresponding to white-surface, white-deep, black-surface, and black-deep.
159 . A method as set forth in claim 151 , wherein the first machine-readable symbol comprises a barcode printed on the surface of the object.
160 . A method as set forth in claim 151 , wherein the first machine-readable symbol comprises a barcode printed on a conformal layer applied over the surface of the object.Join the waitlist — get patent alerts
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