US2015120235A1PendingUtilityA1

System and method for calculating the thermal mass of a building

Assignee: ECOFACTOR INCPriority: Sep 17, 2007Filed: Oct 29, 2014Published: Apr 30, 2015
Est. expirySep 17, 2027(~1.1 yrs left)· nominal 20-yr term from priority
F24F 2130/10F24F 2110/32F24F 2110/12F24F 2130/20G05D 23/19F24F 2140/60G05B 19/048F24F 2130/00F24F 2140/50F24F 11/30F24F 11/56F24F 2120/10G01K 13/00G06F 15/00G01K 1/20F24F 11/32F24F 2110/10F24F 11/62G05D 23/1917F24F 11/65F24F 11/46G05B 2219/2614F24F 11/64F24F 11/58F24F 11/47
62
PatentIndex Score
0
Cited by
0
References
0
Claims

Abstract

The invention comprises a system for calculating a value for the effective thermal mass of a building. The climate control system obtains temperature measurements from at least a first location conditioned by the climate system. One or more processors receive measurements of outside temperatures from at least one source other than the control system and compare the temperature measurements from the first location with expected temperature measurements. The expected temperature measurements are based at least in part upon past temperature measurements obtained by said HVAC control system and said outside temperature measurements. The processors then calculate one or more rates of change in temperature at said first location.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . A system for calculating a value for the effective thermal mass of a building comprising:
 at least one HVAC control system that receives temperature measurements from at least a first location conditioned by at least one HVAC system, and receives status of said HVAC system;   one or more databases that store at least said temperature measurements from said first location over time; and   one or more processors that receive outside temperature measurements associated with outside temperatures from at least one source other than said HVAC system and compare said temperature measurements from said first location with expected temperature measurements wherein the expected temperature measurements are based at least in part upon past temperature measurements and said outside temperature measurements, wherein the one or more processors are configured to calculate one or more rates of change in temperature measurements at said first location and wherein the one or more processors are further configured to relate said calculated rates of change to said outside temperature measurements.

Join the waitlist — get patent alerts

Track US2015120235A1 — get alerts on status changes and closely related new filings.

We store only your email — no account needed. See our privacy policy.