US2015132186A1PendingUtilityA1

Microanalysis methods and systems using field effect transistor

Assignee: KOREA ELECTRONICS TELECOMMPriority: Sep 16, 2010Filed: Jan 20, 2015Published: May 14, 2015
Est. expirySep 16, 2030(~4.1 yrs left)· nominal 20-yr term from priority
G01N 27/3278G01N 27/4145G01N 27/414G01N 27/4146G01N 21/658G01N 33/553G01N 33/54373G01N 27/26G01N 33/54346B82B 3/009G01N 33/53G01N 33/585G01N 33/587
53
PatentIndex Score
0
Cited by
0
References
0
Claims

Abstract

Provided is a microanalysis method and system using a Field Effect Transistor (FET). The microanalysis method includes a channel region having a receptor molecule fixed; forming a nano-particle conjugate in the channel region by supplying a sample for test and the nano-particle conjugate to the FET; growing a probe material on the channel region; and measuring a current flowing through the channel region, wherein the receptor molecule is a material that is selectively bonded to a target molecule in the sample for test.

Claims

exact text as granted — not AI-modified
1 - 8 . (canceled) 
     
     
         9 . A microanalysis system comprising:
 at least one FET having a channel region with a receptor molecule fixed;   a first supplying unit supplying a sample for test and a nano-particle conjugate;   a second supplying unit supplying a probe material;   a measuring unit measuring a current flowing through the channel region;   a first reaction controlling unit controlling a process for forming the nanoparticle conjugate in the channel region; and   a second reaction controlling unit controlling a process for growing the probe material in the channel region.   
     
     
         10 . The microanalysis system of  claim 9 , wherein the FET uses silicon as the channel region. 
     
     
         11 . The microanalysis system of  claim 9 , wherein the FET uses a carbon nano-tube as the channel region. 
     
     
         12 . The microanalysis system of  claim 9 , where the FET, the measuring unit, the first and second supplying units, and the first and second reaction controlling units constitute one of first and second modules separated, the first module comprising the FET, the second module comprising the second supplying unit. 
     
     
         13 . The microanalysis system of  claim 9 , wherein the receptor material is a material that is selectively bonded to a target molecule in the sample for test;
 wherein the nano-particle conjugate is a material that is selectively bonded to the target molecule; and   wherein the probe material is a material that is selectively bonded to the nano-particle conjugate.   
     
     
         14 . The microanalysis system of  claim 9 , further comprising a main controlling unit controlling operations of the first and second supplying units, the first and second reaction controlling units, and the measuring units. 
     
     
         15 . The microanalysis system of  claim 9 , wherein the at least one FET comprises a plurality of separately operating transistors, each of the transistors comprising a source electrode, a drain electrode and a silicon pattern therebetween.

Join the waitlist — get patent alerts

Track US2015132186A1 — get alerts on status changes and closely related new filings.

We store only your email — no account needed. See our privacy policy.