Apparatus for controlling semiconductor chip characteristics

Abstract

Apparatus including functional components of circuitry defined on a semiconductor chip, the functional components including a component having modifiable operating characteristics, a performance measuring circuit providing an output indicative of operating characteristics of the circuitry defined on the semiconductor chip during operation of the circuitry, and computer implemented software means for controlling a value for an operating characteristic of the component having modifiable operating characteristics in response to the output provided by the performance measuring circuit.

1 - 2 . (canceled) 
     
     
         3 . An apparatus comprising:
 an electronic circuit defined on a semiconductor chip, wherein the electronic circuit includes modifiable operating characteristics;   a performance measuring component configured to provide an output indicative of operating characteristics of the electronic circuit; and   software configured to control a value of at least one of the modifiable operating characteristics of the electronic circuit.   
     
     
         4 . The apparatus of  claim 3 , wherein the software is further configured to select clock delays of the electronic circuit so that the timing of data transfer made with respect to a clock signal is controlled. 
     
     
         5 . The apparatus of  claim 3 , wherein the performance measuring component comprises ring oscillators. 
     
     
         6 . The apparatus of  claim 3 , wherein the modifiable operating characteristics are configured to be modified by selecting clock delays that are managed so that the timing of data transfer made with respect to a clock signal is controlled. 
     
     
         7 . The apparatus of  claim 3 , wherein the modifiable operating characteristics are configured to be measured utilizing a ring oscillator. 
     
     
         8 . The apparatus of  claim 3 , wherein the electronic circuit is configured to provide an output signal that is provided as input to circuitry located on a different semiconductor chip than the electronic circuit. 
     
     
         9 . The apparatus of  claim 8 , wherein the software is further configured to affect interface characteristics of the output signal. 
     
     
         10 . A semiconductor chip, comprising:
 an input electronic circuit;   function performing circuitry defined on the semiconductor chip and coupled to the input electronic circuit;   an operating characteristic controlling apparatus coupled to the function performing electronic circuit and including:   a performance measuring component configured to provide an output indicative of operating characteristics of the function performing circuitry; and   a software-implemented component configured to control a value of at least one of a set of modifiable operating characteristics of the function performing circuitry; and   output circuitry coupled to the function performing circuitry.   
     
     
         11 . The semiconductor chip of  claim 10 , wherein the software-implemented component is configured to control the value by selecting clock delays that are managed so that the timing of data transfer made with respect to a clock signal is controlled. 
     
     
         12 . The semiconductor chip of  claim 10 , wherein the performance measuring component comprises ring oscillators. 
     
     
         13 . The semiconductor chip of  claim 10 , wherein the set of modifiable operating characteristics are configured to be modified by selecting clock delays that are managed so that the timing of data transfer made with respect to a clock signal is controlled. 
     
     
         14 . The semiconductor chip of  claim 10 , wherein the set of modifiable operating characteristics are configured to be measured utilizing a ring oscillator. 
     
     
         15 . The semiconductor chip of  claim 10 , wherein the function performing circuitry is configured to provider an output signal that is provided as input to circuitry located on a different semiconductor chip. 
     
     
         16 . The semiconductor chip of  claim 15 , wherein the software-implemented component is configured to affect interface characteristics of the output signal. 
     
     
         17 . An apparatus comprising:
 means for providing an output indicative of operating characteristics of circuitry defined on a semiconductor chip; and   means, comprising software-implemented means, for controlling a value of at least one of a set of modifiable operating characteristic.   
     
     
         18 . (canceled) 
     
     
         19 . The apparatus of  claim 17 , wherein the means for controlling a value is configured to select clock delays that are managed so that the timing of data transfer made with respect to a clock signal is controlled. 
     
     
         20 . The apparatus of  claim 17 , wherein the means for providing an output indicative of operating characteristics comprises ring oscillators. 
     
     
         21 . The apparatus of  claim 17 , wherein the set of modifiable operating characteristics are measured utilizing a ring oscillator. 
     
     
         22 . The apparatus of  claim 17 , wherein the circuitry is configured to provides an output signal that is provided as input to circuitry located on a different semiconductor chip.