US2015194451A1PendingUtilityA1
Liquid crystal display device and method of fabrication for the same
Est. expiryNov 23, 2029(~3.3 yrs left)· nominal 20-yr term from priority
H10D 86/481H10D 86/60H10D 30/0321H10D 30/0316H10D 86/0231G02F 1/136213G02F 2001/136295H01L 27/1255G02F 1/1368G02F 1/1341H01L 29/66765G02F 1/136277G02F 1/136286H01L 27/1288G02F 1/133703G02F 1/133792G02F 1/1393G02F 1/136295
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Claims
Abstract
A liquid crystal display device is disclosed. The device includes: a first substrate, a thin film transistor formed in a first, non-transmissive region on the first substrate, including a gate electrode, a source electrode and a drain electrode, and a storage capacitor formed in a second, transmissive region on the first substrate, where a first electrode and a second electrode of the storage capacitor are made of a transparent conductive material
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A method of fabrication of a liquid crystal display device, the method comprising:
forming a gate electrode of a thin film transistor and a first electrode of a storage capacitor on a first substrate, wherein the gate electrode comprises a transparent conductive material, and a low-resistance metal, stacked together; forming a second electrode of the storage capacitor on a first insulating layer overlapping the first electrode; forming a second insulating layer comprising a depressed pattern exposing a portion of the second electrode; forming a domain forming layer; and forming a pixel electrode on the domain forming layer overlapping the second electrode, wherein the first electrode and the second electrode of the storage capacitor comprise a transparent conductive material.
2 . The method as claimed in claim 1 further comprising:
disposing a second substrate having a common electrode to face the first substrate; and
forming a liquid crystal layer disposed between the first substrate and the second substrate and comprising a reactive mesogen.
3 . The method as claimed in claim 1 wherein the gate electrode and the first electrode are formed using a halftone mask process.
4 . The method as claimed in claim 1 , further comprising:
forming a semiconductor layer above or under a region overlapping the gate electrode; and forming a source electrode and a drain electrode electrically connected with the semiconductor layer.
5 . The method as claimed in claim 1 , further comprising forming a contact electrode on the second electrode exposed by the depressed pattern.Join the waitlist — get patent alerts
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