US2015349158A1PendingUtilityA1
Method of forming contacts for a back-contact solar cell
Est. expiryDec 2, 2030(~4.4 yrs left)· nominal 20-yr term from priority
Inventors:Jane Manning
H10P 32/1412H10P 32/171H10P 32/141H10P 32/14H10F 77/1642H10F 77/219H10F 71/128H10F 10/146H10F 10/14H10F 71/00H10F 77/70H10F 77/148H10F 19/00H01L 31/022441H01L 31/03682H01L 31/03529H01L 31/068Y02E10/546Y02E10/52Y02E10/547
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Claims
Abstract
Methods of forming contacts for solar cells are described. In one embodiment, a method includes forming a silicon layer above a substrate, forming and patterning a solid-state p-type dopant source on the silicon layer, forming an n-type dopant source layer over exposed regions of the silicon layer and over a plurality of regions of the solid-state p-type dopant source, and heating the substrate to provide a plurality of n-type doped silicon regions among a plurality of p-type doped silicon regions.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A solar cell, comprising:
a dielectric layer formed on a substrate; a plurality of n-type dopant-containing silicon regions formed between a plurality of p-type dopant-containing silicon regions; and trenches formed in the plurality of n-type dopant-containing silicon regions and partially in the substrate, wherein the trenches are formed between the plurality of n-type dopant-containing silicon regions and the p-type dopant-containing silicon regions; and conductive contacts in contact with the plurality of n-type dopant-containing silicon regions and the p-type dopant-containing silicon regions.
2 . The solar cell of claim 1 , wherein the dielectric layer has a thickness in the range of 5-50 Angstroms.
3 . The solar cell of claim 1 , wherein the plurality of n-type dopant-containing silicon regions comprise a plurality of n-type doped polysilicon regions with a sheet resistance in the range of 50-300 ohms per square.
4 . The solar cell of claim 1 , wherein the plurality of p-type dopant-containing silicon regions comprise a plurality of p-type doped polysilicon regions with a sheet resistance in the range of 50-300 ohms per square.Join the waitlist — get patent alerts
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