US2016302669A1PendingUtilityA1
Method and apparatus for analysis of turbid media via single-element detection using structured illumination
Est. expiryNov 19, 2029(~3.4 yrs left)· nominal 20-yr term from priority
Inventors:David Cuccia
A61B 5/7271A61B 5/0075A61B 5/0059
52
PatentIndex Score
0
Cited by
0
References
0
Claims
Abstract
Method and apparatus for obtaining qualitative and quantitative analysis of the optical properties or structures of tissue or turbid medium at one or more wavelengths via 1) detection at a single spatial location on the surface of a turbid medium (such as tissue) under two or more structured light conditions or 2) detection at two or more spatial locations on the surface under a single structured light condition.
Claims
exact text as granted — not AI-modified1 . An apparatus for determining surface or subsurface optical properties and/or structures of a sample of turbid media over an area of the sample comprising:
a source to expose the area of the sample to one or more structured illuminations; one or more single element detectors configured to receive optical signals from one or more spatial locations on the surface of the sample; and a signal processor coupled to the one or more single element detectors and configured to reconstruct the optical data from one or more spatial locations.
2 . The apparatus of claim 1 wherein the signal processor is a computer.
3 . The apparatus of claim 1 wherein the source is configured to generate two or more structured light conditions.
4 . The apparatus of claim 3 wherein the one or more single element detectors comprises one single element detector configured to collect remitted light signals from one spatial location.
5 . The apparatus of claim 3 wherein the two or more structured light conditions are spectrally structured.
6 . The apparatus of claim 1 wherein the source is configured to generate one structured light condition.
7 . The apparatus of claim 6 wherein the one or more single element detectors comprise two or more spatially diverse single element detectors configured to collect remitted light signals from two or more spatially diverse locations.
8 . The apparatus of claim 6 wherein the one or more single element detectors comprise two or more spectrally diverse single element detectors configured to collect two or more spectrally diverse remitted light signals.
9 . The apparatus of claim 1 wherein the single element detector is the entrance pupil for an optical relay device.
10 . The apparatus of claim 7 wherein the optical relay device is an optical fiber.
11 . The apparatus of claim 1 wherein an individual one of the one or more spatial locations comprises a region on the order of a feature of an individual one of the one or more structured illuminations.
12 . The apparatus of claim 1 wherein an individual one of the one or more spatial locations comprising comprises a region on the order or smaller than a feature of an individual one of the one or more structured illuminations.
13 . The apparatus of claim 1 wherein an individual one of the one or more spatial locations comprising comprises a region on the order or larger than a feature of an individual one of the one or more structured illuminations.
14 . A method of determining surface or subsurface optical properties and/or structures of a sample of turbid media over an area of the sample comprising:
exposing the area of the sample to one or more structured illuminations; collecting optical signals from one or more spatial locations on the surface of the sample with one or more single-element detectors; and reconstructing optical data from the one or more spatial locations.
15 . The method of claim 12 wherein the step of exposing the area of the sample to one or more structured illuminations includes exposing the area of the sample to two or more structured light conditions.
16 . The method of claim 14 wherein the two or more structured light conditions are spectrally structured.
17 . The method of claim 15 wherein the step of receiving optical signals from one or more spatial locations on the surface of the sample includes receiving optical signals with a single element detector from one spatial location on the surface of the sample when the area of the sample is exposed to two or more structured light conditions.
18 . The method of claim 14 wherein the step of exposing the area of the sample to one or more structured illuminations includes exposing the area of the sample to one structured light condition.
19 . The method of claim 18 wherein the step of receiving optical signals from one or more spatial locations on the surface of the sample includes receiving optical signals with two or more spatially diverse single element detectors from two or more spatially diverse locations on the surface of the sample when the area of the sample is exposed to one structured light condition.
20 . The method of claim 18 wherein the one structured light condition is spectrally structured and the one or more single element detectors comprise two or more spectrally diverse single element detectors configured to collect two or more spectrally diverse remitted light signals.
21 . The method of claim 14 wherein the one or more structured illuminations are spatially structured light waves extending over the surface of the sample.
22 . The method of claim 14 wherein the step of reconstructing includes reconstructing the information from the remitted structured light wave extending over the surface of the area of the sample from the optical signals received with the one or more single-element detectors from the one or more spatial locations on the surface of the sample.
23 . The method of claim 14 wherein the single element detector is the entrance pupil for an optical relay device.
24 . The method of claim 23 wherein the optical relay device is an optical fiber.
25 . The method of claim 14 wherein an individual one of the one or more spatial locations comprises a region on the order of a feature of an individual one of the one or more structured illuminations.
26 . The method of claim 14 wherein an individual one of the one or more spatial locations comprises a region on the order or smaller than a feature of an individual one of the one or more structured illuminations.
27 . The method of claim 14 wherein an individual one of the one or more spatial locations comprises a region on the order or larger than a feature of an individual one of the one or more structured illuminations.Cited by (0)
No later patents cite this yet.
References (0)
No backward citations on record.