Environmental sensor

Abstract

A device for monitoring a working environment in which electronic circuit boards are present includes: a) test circuit boards with pairs of traces and circuitry for determining the electrical resistance between the traces, the test boards being positioned in a pathway effective for directing air across the test traces; b) control elements for controlling the flow of air through the pathway and for controlling power applied to the test board traces; c) data storage for storing data relating to acceptable electrical resistance between test traces; d) circuitry for comparing measured electrical resistance between two test traces to a stored value for the acceptable electrical resistance between two test traces; and e) an output for communicating the results of the comparison between the measured electrical resistance between two test traces and the stored value for the acceptable electrical resistance between two test traces.

1 . A method for evaluating the effects of environmental air on a processed circuit board, the method comprising:
 a) providing a test probe comprising a circuit board processed by a method to be evaluated, wherein the test probe comprises a pair of traces and circuitry effective for determining the electrical resistance between said traces, wherein the traces are separated by a test distance;   b) measuring the electrical resistance between the two traces of said test probe at a first test probe measurement time;   c) communicating information relating to the measured electrical resistance between the two traces of said test probe as measured at said first time to a device that stores data, or analyzes data, or stores and analyzes data;   d) confirming that the measured electrical resistance between the two traces of said test probe as measured at said first time is at an acceptable level as defined by a pre-determined acceptance standard;   e) exposing the test probe to environmental air to be tested;   f) making one or more subsequent measurements of the electrical resistance between the two traces of said test probe after exposure of the test probe to environmental air;   g) communicating information relating to the one or more subsequent measurements to a device that stores data, or analyzes data, or stores and analyzes data; and   h) determining when the measured electrical resistance between the two traces of said test probe changes to an unacceptable level as defined by a pre-determined acceptance standard.   
     
     
         2 . The method of  claim 1  and further comprising the step of evaluating changes in the electrical resistance between the two test probe traces over an exposure period. 
     
     
         3 . The method of  claim 1  wherein the test probe is provided in a device for evaluating the effects of exposure to an environmental air on a processed circuit board, wherein said device comprises:
 a) a test probe socket for receiving said test probe and for connecting said test probe to a device that stores data, or analyzes data, or stores and analyzes data; 
 b) a substantially enclosed pathway for directing environmental air across the traces of said test probe; 
 c) a fan for blowing environmental air through said pathway and across said test probe; 
 d) a control element for controlling a fan to selectively blow or not blow air through said pathway and across said test probe; 
 e) a control element for controlling power applied to one or more of the test probe traces; 
 f) data storage for storing data relating to measured electrical resistance between the test probe traces; 
 g) data storage for storing data relating to acceptable electrical resistance between test probe traces; 
 h) circuitry for comparing a measured electrical resistance between two test probe traces to a stored value for the acceptable electrical resistance between two test probe traces; and 
 i) an output for communicating the results of the comparison between the measured electrical resistance between two test probe traces and the stored value for the acceptable electrical resistance between two test probe traces. 
 
     
     
         4 . The method of  claim 3  wherein said step of “measuring the electrical resistance between the two traces of said test probe at a first test probe measurement time” occurs before a first occurrence of said step of “exposing the test probe to environmental air to be tested.” 
     
     
         5 . The method of  claim 3  wherein said step of “measuring the electrical resistance between the two traces of said test probe at a first test probe measurement time” occurs after a first occurrence of said step of “exposing the test probe to environmental air to be tested.” 
     
     
         6 . The method of  claim 3  wherein the test probe further includes a resistance to square wave converter to convert a measured electrical resistance to digital output data representing the measured resistance. 
     
     
         7 . The method of  claim 3  wherein the test probe includes a connection end with a keyed connector that is inserted into said test probe socket in an orientation that allows proper communication between the test probe and the control system. 
     
     
         8 . The method of  claim 3  wherein the test probe is provided in a device that also includes a second circuit board processed by a method to be evaluated, wherein the second circuit board comprises a pair of traces and circuitry effective for determining the electrical resistance between said traces, wherein the traces are separated by a test distance, and wherein the second circuit board is located at a location that is remote from said pathway for directing environmental air across the traces of said test probe; and wherein the method further includes the steps of:
 i) measuring the electrical resistance between the two traces of the second circuit board at a first second circuit board measurement time, wherein said first second circuit board measurement time may be the same time or a different time than the first test probe measurement time; 
 ii) communicating information relating to the measured electrical resistance between the two traces of the second circuit board as measured at said first second circuit board measurement time to a device that stores data, or analyzes data, or stores and analyzes data; 
 iii) confirming that the measured electrical resistance between the two traces of the second circuit board as measured at said first second circuit board measurement time is at an acceptable level as defined by a pre-determined acceptance standard; 
 iv) making one or more subsequent measurements of the electrical resistance between the two traces of the second circuit board; 
 v) communicating information relating to the one or more subsequent measurements to a device that stores data, or analyzes data, or stores and analyzes data; and 
 vi) using the measured electrical resistance between the two traces of said second circuit board as a baseline for determining the length of time that the resistance between two traces of a circuit board should be expected to remain at an acceptable level, as defined by a pre-determined acceptance standard, when the circuit board is not exposed to a flow of environmental air. 
 
     
     
         9 . A device for evaluating the effects of exposure to an environmental air on a processed circuit board, comprising:
 a) a test probe comprising a circuit board processed by a method to be evaluated, wherein the test probe comprises a pair of traces and circuitry effective for determining the electrical resistance between said traces, wherein the traces are separated by a test distance;   b) a test probe socket for receiving said test probe and for connecting said test probe to a device that stores data, or analyzes data, or stores and analyzes data;   c) a pathway for directing environmental air across the traces of said test probe;   d) a fan for blowing environmental air through said pathway and across said test probe;   e) a control element for controlling a fan to selectively blow or not blow air through said pathway and across said test probe;   f) a control element for controlling power applied to one or more of the test probe traces;   g) data storage for storing data relating to measured electrical resistance between the test probe traces;   h) data storage for storing data relating to acceptable electrical resistance between test probe traces;   i) circuitry for comparing a measured electrical resistance between two test probe traces to a stored value for the acceptable electrical resistance between two test probe traces; and   j) an output for communicating the results of the comparison between the measured electrical resistance between two test probe traces and the stored value for the acceptable electrical resistance between two test probe traces.   
     
     
         10 . The device of  claim 9  wherein said test probe further includes a resistance to square wave converter to convert a measured electrical resistance to digital output data representing the measured resistance. 
     
     
         11 . The device of  claim 9  wherein said test probe also includes a connection end with a keyed connector that may be inserted into said test probe socket only in an orientation that allows proper communication between the test probe and the control system. 
     
     
         12 . The device of  claim 9  wherein the device also includes a second circuit board processed by a method to be evaluated, wherein the second circuit board comprises a pair of traces and circuitry effective for determining the electrical resistance between said traces, wherein the traces are separated by a test distance, and wherein the second circuit board is located at a location that is remote from said pathway for directing environmental air across the traces of said test probe.