Microscope and microscopy techniques

Abstract

A microscope with at least one illumination beam that is phase modulated in a section along its cross-section with a modulation frequency and a microscope lens for focusing the illumination beam into a test as well as a detection beam path and at least one means of demodulation, wherein at least one polarization altering item is scheduled in the illuminating beam path, for which a phase plate is subordinated that exhibits at least two areas with different phase influence. A second embodiment involves a microscope with at least one illumination beam and a microscope lens for focusing the illumination beam into a test as well as a detection beam path with at least one demodulator, wherein the illumination beam is set up alternatingly on at least two beam paths, and an element in one of the beam paths is scheduled to generate a field mode different from that of the first beam path, and the two beam paths are overlaid with different field modes in the focus.

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         14 . A microscope with at least one illumination beam and a microscope lens for focusing the illumination beam into a test, as well as a detection beam path with at least one demodulator, wherein the illumination beam is apportioned alternately to at least two beam paths and, on one of the beam paths, an element is scheduled for generating a field mode that is different from the first beam path and the two beam paths are overlaid with different field modes in the focus. 
     
     
         15 . A microscope according to  claim 14 , wherein switching the beam paths takes place by a polarization switch. 
     
     
         16 . A microscope according to  claim 15 , wherein the polarization switch consists of at least one electro-optical modulator and at least one pole splitter. 
     
     
         17 . A microscope according to  claim 14 , wherein a mode deviating from the Gauss, mode, specifically a donut mode, is generated. 
     
     
         18 . A microscope according to  claim 14 , wherein the beam paths are generated as two orderings after the passageway of the illumination beam by an AOM or AOTF. 
     
     
         19 . A microscope according to  claim 18 , wherein the beam paths are generated alternatingly and are linked back via reflectors by the AOM or AOTF into the same beam direction. 
     
     
         20 . A microscope according to  claim 14 , wherein for generating the different field mode a spiral phase mask or a diffractive optical element or a spatial light modulator (SLM is deployed. 
     
     
         21 . A microscope according to  claim 14 , wherein several beams of light are scheduled which, however, are in each case apportioned on the beam paths and preferably several elements are scheduled to generate a different field mode in one of the beam paths. 
     
     
         22 . A microscopy method according to  claim 14 , wherein a test with at least one illumination beam is illuminated using a microscope lens for focusing and at least one demodulation takes place in one beam path, wherein the illumination beam is set up alternatingly on at least two beam paths and on one of the beam paths a field mode is generated that differs from the other beam path and the two beam paths are overlaid with different field modes. 
     
     
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