Graphite-based carbon material useful as graphene precursor, as well as method of producing the same

Abstract

Provided is a graphite-based carbon material useful as a graphene precursor, from which graphene is easily exfoliated when the graphite-based carbon material is useful as a precursor and from which a highly-concentrated graphene dispersion can easily be obtained. The graphite-based carbon material is a graphite-based carbon material useful as a graphene precursor wherein a Rate (3R) based on an X-ray diffraction method, which is defined by following Equation 1 is 31% or more: Rate (3R)=P3/(P3+P4)×100   Equation 1 wherein P3 is a peak intensity of a (101) plane of the rhombohedral graphite layer (3R) based on the X-ray diffraction method, and P4 is a peak intensity of a (101) plane of the hexagonal graphite layer (2H) based on the X-ray diffraction method.

1 . A graphite-based carbon material useful as a graphene precursor, having a rhombohedral graphite layer (3R) and a hexagonal graphite layer (2H), wherein a Rate (3R) of the rhombohedral graphite layer (3R) and the hexagonal graphite layer (2H), based on an X-ray diffraction method, which is defined by following Equation 1 is 31% or more:
   Rate (3 R )= P 3/( P 3+ P 4)×100   Equation 1
     wherein   P3 is a peak intensity of a (101) plane of the rhombohedral graphite layer (3R) based on the X-ray diffraction method, and   P4 is a peak intensity of a (101) plane of the hexagonal graphite layer (2H) based on the X-ray diffraction method.   
     
     
         2 . The graphite-based carbon material useful as a graphene precursor according to  claim 1 , wherein the Rate (3R) is 40% or more. 
     
     
         3 . The graphite-based carbon material useful as a graphene precursor according to  claim 1 , wherein the Rate (3R) is 50% or more. 
     
     
         4 . The graphite-based carbon material useful as a graphene precursor according to  claim 1 , wherein an intensity ratio P1/P2 of the hexagonal graphite layer (2H) based on the X-ray diffraction method is 0.01 or more, wherein
 P1 is a peak intensity of a (100) plane of the hexagonal graphite layer (2H) based on the X-ray diffraction method, and   P2 is a peak intensity of a (002) plane of the hexagonal graphite layer (2H) based on the X-ray diffraction method.   
     
     
         5 . The graphite-based carbon material useful as a graphene precursor according to  claim 1 , wherein the graphite-based carbon material is produced by carrying out a radiowave-force-based treatment and a physical-force-based treatment in a vacuum or in the air. 
     
     
         6 . A method of producing the graphite-based carbon material useful as a graphene precursor according to  claim 1 , comprising: carrying out a radiowave-force-based treatment and a physical-force-based treatment to a natural graphite material in a vacuum or in the air. 
     
     
         7 . A method of producing a graphite-based carbon material useful as a graphene precursor, wherein the natural graphite material as set forth in  claim 5  has at least a hexagonal graphite layer (2H), and an intensity ratio P1/P2 of the hexagonal graphite layer (2H) based on the X-ray diffraction method is less than 0.01, wherein
 P1 is a peak intensity of a (100) plane of the hexagonal graphite layer (2H) based on the X-ray diffraction method, and 
 P2 is a peak intensity of a (002) plane of the hexagonal graphite layer (2H) based on the X-ray diffraction method. 
 
     
     
         8 . A graphite-based carbon material, having a rhombohedral graphite layer (3R) and a hexagonal graphite layer (2H), wherein a Rate (3R) of the rhombohedral graphite layer (3R) and the hexagonal graphite layer (2H), based on an X-ray diffraction method, which is defined by following Equation 1 is 31% or more:
   Rate (3 R )= P 3/( P 3+ P 4)×100   Equation 1
     wherein   P3 is a peak intensity of a (101) plane of the rhombohedral graphite layer (3R) based on the X-ray diffraction method, and   P4 is a peak intensity of a (101) plane of the hexagonal graphite layer (2H) based on the X-ray diffraction method.