Analysis and purging of materials in manufacturing processes
Abstract
Various systems and methods of analyzing one or more properties of a sample are provided. The system includes a self-contained purging device having a sample holder and one or more analyzers for analyzing one or more properties of the sample. The purging device is configured to remove sample contained within the sample holder when an analysis is complete. In one embodiment the purging device is configured via an air pump having a tube in fluid communication with an air inlet of the sample holder, wherein the air pump is configured to deliver pressurized air to the air inlet and thereby purge the sample. The pressurized air is localized ambient air, and substantially free of contaminants. Methods and other systems are also described and illustrated.
Claims
exact text as granted — not AI-modified1 - 25 . (canceled)
26 . A system for analyzing a property a sample from continuous production process, wherein the system comprises:
a sample holder comprising a window, wherein the sample holder is configured to receive a sample from a continuous production process; a spectroscopic analyzer operatively coupled to the window, wherein the spectroscopic analyzer is configured to determine a property of the sample; and a purge device operatively coupled to the sample holder and configured to expunge the sample from the sample holder.
27 . The system of claim 26 , wherein the sample comprise particles, crystals, or a combination thereof.
28 . The system of claim 26 , wherein the sample comprises pharmaceutical powder, fine chemicals, specialty chemicals, or a combination of any of the foregoing.
29 . The system of claim 26 , wherein the sample comprises proteins, DNA, or whole cells.
30 . The system of claim 26 , wherein the sample comprises a material, and the spectroscopic analyzer is configured to determine a property of the material.
31 . The system of claim 26 , wherein the sample holder comprises a well, and a sample inlet coupled to the well, wherein the window is disposed within the well.
32 . The system of claim 31 , wherein the well is configured to temporarily retain the sample.
33 . The system of claim 31 , wherein the sample holder comprises a moveable cover configured to temporarily cover the well.
34 . The system of claim 33 , wherein the moveable cover pivotally, hingedly, or slideably attached to the body of the sample holder.
35 . The system of claim 31 , wherein the well comprises a purge inlet, wherein the purge device is coupled to the purge inlet.
36 . The system of claim 32 , wherein the well comprises an outlet.
37 . The system of claim 26 , wherein the purging device comprises an apparatus configured to generate pressurized air, vibrations, acoustic energy, ultrasonic energy, or a negative pressure.
38 . The system of claim 26 , wherein the purging device comprises a pressurized air pump.
39 . The system of claim 26 , wherein the purging device comprises a peristaltic pump.
40 . A manufacturing process comprising the system of claim 26 .
41 . The manufacturing process of claim 39 , wherein the manufacturing process comprises a continuous flow of material, and the sample holder is operatively coupled to the continuous flow of material.
42 . The manufacturing process of claim 40 , wherein the continuous flow of material comprises pharmaceutical powder, fine chemicals, specialty chemicals, or a combination of any of the foregoing.
43 . A method of analyzing a sample of material in a continuous production process, comprising:
providing a continuous flow of material and the system of claim 26 , wherein the sample holder is operatively coupled to the continuous flow of material; obtaining a sample of material from the continuous flow of material in the sample holder; spectroscopically analyzing the sample of material; and purging the sample of material from the sample holder.Cited by (0)
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