Potentiometer based controller for oven
Abstract
A temperature control system for controlling an oven temperature comprises a potentiometer and a processor. The potentiometer comprises a shaft and at least a first and a second terminal, and provides a variable resistance between the first terminal and the second terminal in response to a rotation of the shaft. The variable resistance forms a resistance output value. The processor is configured to detect one of a plurality of set point modes each comprising a different number of non-sequential temperature set points each of which span a range of resistances of the potentiometer, and convert the output resistance of the potentiometer into a temperature setting signal that corresponds with a temperature assigned to the resistance range of the measured resistance output.
Claims
exact text as granted — not AI-modified1 . A temperature control system for controlling an oven temperature, comprising:
a potentiometer having a shaft and at least a first and a second output terminal, the potentiometer configured to provide a variable resistance between the first and the second output terminal in response to a rotation of the shaft, the variable resistance forming a resistance output signal; and a processor configured to convert the resistance output signal into one of a plurality of discrete temperature settings, where each discrete temperature setting spans a range of resistances of the potentiometer that is less than a full resistance of the potentiometer.
2 . The temperature control system of claim 1 , where the plurality of discrete temperature settings comprise three different temperatures.
3 . The temperature control system of claim 1 , where the plurality of discrete temperature settings comprises five different temperatures.
4 . The temperature control system of claim 1 , where the plurality of discrete temperature settings comprise eight different temperatures.
5 . The temperature control system of claim 1 , where the range of resistances comprises three equally sized regions.
6 . The temperature control system of claim 1 , where the range of resistances comprises five equally sized regions.
7 . The temperature control system of claim 1 , where the range of resistances comprises eight equally sized regions.
8 . The temperature control system of claim 1 , where the range of resistances comprises at least one region whose resistance range is larger than another region's resistance range.Join the waitlist — get patent alerts
Track US2018224128A1 — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.