US2018274075A1PendingUtilityA1
Assembly fabrication and modification of elasticity in materials
Assignee: GYRUS ACMI INC DBA OLYMPUS SURGICAL TECHNOLOGIES AMERICAPriority: May 6, 2014Filed: May 31, 2018Published: Sep 27, 2018
Est. expiryMay 6, 2034(~7.8 yrs left)· nominal 20-yr term from priority
B06B 3/00G10K 11/24C22C 14/00C22F 1/183G01N 29/221A61B 8/4444C22F 1/18
60
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Claims
Abstract
A fabricator resource receives an assembly including a first portion of material and a second portion of material. Initially, the first portion of material in the assembly may have a different modulus of elasticity than the second portion of material. The fabricator resource exposes the assembly to one or more heating/cooling cycles. Exposure of the assembly to the one or more heating/cooling cycles modifies a modulus of elasticity of the first portion of material and a modulus of elasticity of the second portion of material to desired target values (such as substantially same or different values).
Claims
exact text as granted — not AI-modifiedWe claim:
1 . A method for manufacturing an ultrasonic probe assembly comprising:
receiving the ultrasonic probe assembly including at least a first portion of material and a second portion of material; and controlling exposure of the first portion of material and the second portion of material in the ultrasonic probe assembly to different temperatures, the controlled exposure causing a modulus of elasticity of the first material in the ultrasonic probe assembly to be substantially different than a modulus of elasticity of the second material in the ultrasonic probe assembly.
2 . The method as in claim 1 , wherein controlling exposure of the ultrasonic probe assembly to different temperatures includes:
exposing the first portion of material in the ultrasonic probe assembly to a first temperature for a controlled amount of time to set a modulus of elasticity of the first portion of material to be a first elasticity value; and exposing the second portion of material in the ultrasonic probe assembly to a second temperature for a controlled amount of time to set a modulus of elasticity of the second portion of material to be a second elasticity value, the second elasticity value substantially different than the first elasticity value.
3 . The method as in claim 1 , wherein the controlled exposure of the ultrasonic probe assembly to different temperatures causes the modulus of elasticity of the ultrasonic probe assembly to vary along a length from a distal end of the ultrasonic probe assembly to a proximal end of the ultrasonic probe assembly.
4 . The method as in claim 1 , wherein controlling exposure of the first portion of material and the second portion of material in the ultrasonic probe assembly to different temperatures, tunes the first portion of material to a first resonant frequency value and second portion of material to a second resonant frequency value.
5 . The method as in claim 1 , wherein the first portion of material and the second portion of material are Titanium alloys.
6 . An ultrasonic probe assembly comprising:
a first portion of material having a first elasticity; and a second portion of material, having a second elasticity, attached to the first portion of material; the first and the second elasticity are adjusted to enable the ultrasonic probe assembly to convey an ultrasonic frequency in a desired target range.
7 . The ultrasonic probe assembly as in claim 6 , wherein the first portion of material and the second portion of material have a substantially same modulus of elasticity.
8 . The ultrasonic probe assembly as in claim 6 , wherein the first portion of material and the second portion of material are Titanium alloys.
9 . The ultrasonic probe assembly as in claim 7 , wherein the substantially same modulus of elasticity to which the first portion of material and the second portion of material are adjusted is a Young's modulus value of E=103.0 GigaPascals to 111.0 GigaPascals.
10 . The ultrasonic probe assembly as in claim 16 , wherein the desired target range to which the ultrasonic probe assembly is tuned is 50±3.5 KiloHertz.Cited by (0)
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