US2018275344A1PendingUtilityA1
Sacrificial grating coupler for testing v-grooved integrated circuits
Est. expiryJun 30, 2036(~10 yrs left)· nominal 20-yr term from priority
G02B 6/305G02B 6/423G02B 6/34G02B 6/136G02B 2006/12061G02B 2006/12107
57
PatentIndex Score
0
Cited by
0
References
0
Claims
Abstract
Embodiments are directed to a method of forming an optical coupler system. The method includes forming at least one waveguide over a substrate, and forming a sacrificial optical coupler in a first region over the substrate. The method further includes configuring the sacrificial optical coupler to couple optical signals to or from the at least one waveguide, and forming a v-groove in the first region over the substrate, wherein forming the v-groove includes removing the sacrificial optical coupler from the first region.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . An optical coupler system comprising:
at least one waveguide formed over a substrate; and a sacrificial optical coupler formed in a first region over the substrate; wherein the sacrificial optical coupler is configured to couple optical signals to or from the at least one waveguide; wherein the first region defines an area in which a v-groove will be formed during a subsequent fabrication operation of the optical coupler system.
2 . The system of claim 1 , wherein the subsequent fabrication operation comprises one or more etch operations.
3 . The system of claim 1 , wherein the sacrificial optical coupler comprises a sacrificial grating coupler.
4 . The system of claim 1 , wherein the sacrificial optical coupler is configured to couple optical signals to or from an optical fiber.
5 . The system of claim 1 , wherein the sacrificial optical coupler is configured to perform a test operation comprising coupling optical signals through the sacrificial optical coupler to or from the at least one waveguide.
6 . The system of claim 5 further comprising at least one optoelectronic component formed over the substrate.
7 . The system of claim 6 further comprising the at least one waveguide coupled to the at least one optoelectronic component.
8 . The system of claims 7 , wherein the test operation further comprises coupling optical signals through the at least one waveguide to or from the at least one optoelectronic component.
9 . The system of claim 1 , wherein the v-groove is configured to couple optical signals to or from the at least one waveguide.
10 . The system of claim 9 , wherein an optical fiber is coupled to the v-groove.
11 . The system of claim 10 , wherein the v-groove is configured to couple optical signals to or from the optical fiber.
12 . The system of claim 1 , wherein the sacrificial optical coupler comprises fully etched silicon gratings formed in a silicon-on-insulator (SOI) layer.
13 . The system of claim 1 , wherein the sacrificial optical coupler comprises partially etched gratings formed in a silicon-on-insulator (SOI) layer.
14 . The system of claim 1 , wherein the sacrificial optical coupler comprises fully etched polysilicon gratings formed in a polysilicon gate layer.
15 . The system of claim 1 , wherein the sacrificial optical coupler comprises fully etched silicon nitride gratings.
16 . An optical coupler system comprising:
at least one waveguide formed over a substrate; and sacrificial gratings formed in a first region over the substrate; wherein the sacrificial gratings are configured to couple optical signals to or from the at least one waveguide; wherein the first region defines an area in which a v-groove will be formed during a subsequent fabrication operation of the optical coupler system.
17 . The system of claims 16 , wherein the subsequent fabrication operation comprises one or more etch operations.
18 . The system of claim 17 , wherein the v-groove is configured to couple optical signals to or from the at least one waveguide.
19 . The system of claim 18 , wherein the v-groove is further configured to couple optical signals to or from an optical fiber.
20 . The system of claim 16 further comprising:
at least one optoelectronic component formed over the substrate; and
the at least one waveguide coupled to the at least one optoelectronic component;
wherein the sacrificial gratings are configured to perform a test operation comprising coupling optical signals through the sacrificial gratings to or from the at least one waveguide;
wherein the test operation further comprises coupling optical signals through the at least one waveguide to or from the at least one optoelectronic component.Cited by (0)
No later patents cite this yet.
References (0)
No backward citations on record.