Charged particle beam treatment system

Abstract

A charged particle beam treatment system includes a cyclotron that accelerates charged particles so as to emit a charged particle beam, an irradiation nozzle that irradiates a patient with the charged particle beam, a beam transport line along which the charged particle beam B emitted from the cyclotron is transported to the irradiation nozzle, profile monitors and that are provided in the beam transport line and detect a position of the beam, and steering electromagnets that are provided on an upstream side of the profile monitors, and adjust a position of the beam.

What is claimed is: 
     
         1 . A charged particle beam treatment system comprising:
 a cyclotron configured to accelerate charged particles so as to emit a charged particle beam;   an irradiation device configured to irradiate an irradiation object with the charged particle beam;   a beam transport line along which the charged particle beam emitted from the cyclotron is transported to the irradiation device;   a beam position detection unit that is provided in the beam transport line and configured to detect a position of the passing charged particle beam; and   a beam position adjustment unit that is provided on an upstream side of the beam position detection unit, and configured to adjust a position of the charged particle beam.   
     
     
         2 . The charged particle beam treatment system according to  claim 1 ,
 wherein the beam position detection unit includes   a first detection unit configured to detect a position of the passing charged particle beam, and   a second detection unit that is provided on a downstream side of the first detection unit, and configured to detect a position of the passing charged particle beam.   
     
     
         3 . The charged particle beam treatment system according to  claim 1 , further comprising:
 a degrader that is provided in the beam transport line, and configured to reduce and adjust the energy of the passing charged particle beam,   wherein the beam position detection unit is provided on a downstream side of the degrader, and   wherein the beam position adjustment unit is provided on an upstream side of the degrader.   
     
     
         4 . The charged particle beam treatment system according to  claim 1 , further comprising:
 a degrader that is provided in the beam transport line, and configured to reduce and adjust the energy of the passing charged particle beam,   wherein the beam position detection unit includes   a particle detector configured to detect particles generated when the charged particle beam passes through the degrader, and   a position calculation unit configured to detect a position where the particles detected by the particle detector are generated.   
     
     
         5 . The charged particle beam treatment system according to  claim 4 ,
 wherein the degrader includes   a first damping member that reduces the energy of the passing charged particle beam, and   a second damping member that is provided on a downstream side of the first damping member, and reduces the energy of the passing charged particle beam, and   wherein the particle detector includes   a first particle detector configured to detect particles generated when the charged particle beam passes through the first damping member, and   a second particle detector configured to detect particles generated when the charged particle beam passes through the second damping member.   
     
     
         6 . The charged particle beam treatment system according to  claim 2 ,
 wherein the beam position adjustment unit includes   a first deflection unit configured to deflect the charged particle beam, and   a second deflection unit that is provided on a downstream side of the first deflection unit, and configured to deflect the charged particle beam.