US2019109326A1PendingUtilityA1

Submicron Sized Silicon Powder with Low Oxygen Content

Assignee: UMICORE NVPriority: Jun 29, 2010Filed: Dec 6, 2018Published: Apr 11, 2019
Est. expiryJun 29, 2030(~3.9 yrs left)· nominal 20-yr term from priority
H01M 2004/027C01B 33/113H01M 4/386H01M 4/483H01M 4/134H01M 4/628C01P 2004/64C01B 33/029C01B 33/00H01M 4/366H01M 4/38C01B 33/03C01B 33/02C01B 33/027C01P 2004/62H01M 10/0525H01M 4/58Y02E60/10C01P 2006/40H01M 2220/30
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Claims

Abstract

A submicron sized Si based powder having an average primary particle size between 20 nm and 200 nm, wherein the powder has a surface layer comprising SiO x , with 0<x<2, the surface layer having an average thickness between 0.5 nm and 10 nm, and wherein the powder has a total oxygen content equal or less than 3% by weight at room temperature. The method for making the powder comprises a step where a Si precursor is vaporized in a gas stream at high temperature, after which the gas stream is quenched to obtain Si particles, and the Si particles are quenched at low temperature in an oxygen containing gas.

Claims

exact text as granted — not AI-modified
1 - 16 . (canceled) 
     
     
         17 . A Si powder having an average primary particle size between 20 nm and 200 nm, wherein the powder has a SiOx surface layer, with 0<x<2, the surface layer having an average thickness between 0.5 nm and 10 nm, and wherein the powder has a total oxygen content equal or less than 3% by-weight at room temperature. 
     
     
         18 . The Si powder of  claim 17 , wherein the surface layer has an average thickness between 0.5 nm and 5 nm. 
     
     
         19 . The Si powder of  claim 17 , having an oxidized SiOx surface layer with 1≤x<2. 
     
     
         20 . The Si powder of  claim 17 , having a purity of at least 98 at % Si. 
     
     
         21 . The Si powder of  claim 17 , having a total oxygen content less than 4% by weight after being aged for 1 hour at 500° C. under atmospheric conditions and in air. 
     
     
         22 . The Si powder of  claim 17 , having a total oxygen content less than 5% by weight after being aged for 1 hour at 700° C. under atmospheric conditions and in air. 
     
     
         23 . The Si powder of  claim 17 , further comprising an element M selected from the group consisting of transition metals, metalloids, Group IIIa elements and carbon. 
     
     
         23 . The Si powder of  claim 23 , wherein M comprises either one of more elements selected from the group consisting of nickel, copper, iron, tin, aluminium and cobalt. 
     
     
         24 . A Li-ion secondary battery comprising the Si powder of  claim 17  as a negative electrode material. 
     
     
         25 . A method for manufacturing the Si powder of  claim 17 , comprising:
 providing a Si precursor,   providing a gas stream at a temperature of at least 1727° C.,   injecting the Si precursor into the gas stream, thereby vaporizing the Si precursor,   quenching the gas stream carrying the vaporized Si precursor to a temperature below 1327° C., thereby obtaining Si particles,   passivating the Si particles in an oxygen containing gas at a temperature below 700° C., and   separating the Si particles from the gas stream after passivation.   
     
     
         26 . The method of  claim 25 , wherein passivation is performed at a temperature below 450° C. 
     
     
         27 . The method of  claim 26 , wherein passivation is performed at a temperature between room temperature and 100° C. 
     
     
         28 . The method of  claim 25 , wherein the gas stream is provided by a gas burner, a hydrogen burner, an RF plasma or a DC arc plasma. 
     
     
         29 . The method of  claim 25 , wherein passivation is performed in an oxygen containing gas comprising one or more additional components selected from the group consisting of Ar, N2, H2, CO and CO2. 
     
     
         30 . The method of  claim 29 , wherein the oxygen containing gas is a mixture of oxygen and nitrogen, with less than 1% oxygen by weight. 
     
     
         31 . The method of  claim 25 , wherein passivation is carried out for a period of less than 60 minutes. 
     
     
         32 . The method of  claim 31 , wherein passivation is carried out for a period of less than 10 minutes. 
     
     
         33 . The method of  claim 25 , wherein the gas stream is provided in a radio frequency inductively coupled plasma, and wherein the gas stream comprises argon gas.

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