US2020058827A1PendingUtilityA1

Near-Ultraviolet Light-Emitting Semiconductor Light-Emitting Element And Group III Nitride Semiconductor Template Used Therefor

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Assignee: SOFT EPI INCPriority: Mar 10, 2016Filed: Feb 10, 2017Published: Feb 20, 2020
Est. expiryMar 10, 2036(~9.7 yrs left)· nominal 20-yr term from priority
H01L 33/32H01L 33/42H01L 33/22H10H 20/882H10H 20/812H10H 20/01335H10H 20/833H10H 20/825H10H 20/819H10H 20/815H10H 20/82
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Abstract

Disclosed is a Group III nitride semiconductor template for a 300-400 nm near-ultraviolet light emitting semiconductor device, the template including: a growth substrate; a nucleation layer based on Al x Ga 1-x N (0<x≤1, x>y); and a monocrystalline Group III nitride semiconductor layer based on Al y Ga 1-y N (y>0), and a near-ultraviolet light emitting semiconductor device using the template.

Claims

exact text as granted — not AI-modified
What is claimed: 
     
         1 . A Group III nitride semiconductor template for a 300-400 nm near-ultraviolet light emitting semiconductor device, the template comprising:
 a growth substrate;   a nucleation layer based on Al x Ga 1-x N (0<x≤1, x>y); and   a monocrystalline Group III nitride semiconductor layer based on Al y Ga 1-y N (y>0).   
     
     
         2 . The Group III nitride semiconductor template for a near-ultraviolet light emitting semiconductor device according to  claim 1 , wherein the growth substrate comprises protruded and depressed portions for scattering light, and the Group III nitride semiconductor layer is adapted to cover the protruded and depressed portions. 
     
     
         3 . The Group III nitride semiconductor template for a near-ultraviolet light emitting semiconductor device according to  claim 2 , wherein the Group III nitride semiconductor layer comprises a first layer growing from the nucleation layer, a second layer covering the first layer and being coalesced together from above, and a third layer flat on top of the second layer. 
     
     
         4 . The Group III nitride semiconductor template for a near-ultraviolet light emitting semiconductor device according to  claim 1 , wherein Al composition value x in the nucleation layer is larger than Al composition value y in the Group III nitride semiconductor layer in order to protect the nucleation layer from desorption at a growth temperature of the Group III nitride semiconductor layer. 
     
     
         5 . The Group III nitride semiconductor template for a near-ultraviolet light emitting semiconductor device according to  claim 1 , wherein the nucleation layer is AlN. 
     
     
         6 - 10 . (canceled)

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