Measuring method for measuring concentration of donor element solid-solved in ceramic grains in ceramic dielectric layers

Abstract

A measuring method for measuring a concentration of a donor element which is solid-solved in ceramic grains of a plurality of ceramic dielectric layers, includes measuring (a current value at 10 V/μm when a direct voltage is applied to a plurality of ceramic dielectric layers at 125 degrees C.)/(a current value at 10 V/μm when a direct voltage is applied to the plurality of the ceramic dielectric layers at 85 degrees C.), with respect to a multilayer ceramic capacitor having a multilayer structure in which each of the plurality of ceramic dielectric layers and each of a plurality of internal electrode layers are alternately stacked.

What is claimed is: 
     
         1 . A measuring method comprising:
 measuring a concentration of a donor element which is solid-solved in ceramic grains of a plurality of ceramic dielectric layers, by measuring (a current value at 10 V/μm when a direct voltage is applied to a plurality of ceramic dielectric layers at 125 degrees C.)/(a current value at 10 V/μm when a direct voltage is applied to the plurality of the ceramic dielectric layers at 85 degrees C.), with respect to a multilayer ceramic capacitor having a multilayer structure in which each of the plurality of ceramic dielectric layers and each of a plurality of internal electrode layers are alternately stacked.   
     
     
         2 . The measuring method as claimed in  claim 1 , wherein an average grain diameter of the plurality of ceramic dielectric layers is 80 nm or more and 200 nm or less. 
     
     
         3 . The measuring method as claimed in  claim 1 , wherein the donor element is at least one of V, Mo, Nb, La, W and Ta. 
     
     
         4 . The measuring method as claimed in  claim 1 , wherein a thickness of the plurality of ceramic dielectric layers is 1 μm or less. 
     
     
         5 . The measuring method as claimed in  claim 1 , where a main component ceramic of the plurality of ceramic dielectric layers has a perovskite structure.