US2020409263A1PendingUtilityA1
Photosensitive resin composition, method for manufacturing cured relief pattern, and semiconductor apparatus
Est. expiryMar 31, 2036(~9.7 yrs left)· nominal 20-yr term from priority
Inventors:Tomohiro YorisueTaihei InoueYoshito IdoMitsutaka NakamuraTomoshige YunokuchiDaisuke SasanoTakahiro Sasaki
G03F 7/0387G03F 7/0048C08K 5/375C08K 5/33H05K 2201/0154H05K 3/287H05K 3/022G03F 7/26G03F 7/20G03F 7/162G03F 7/0388G03F 7/0382G03F 7/037G03F 7/031G03F 7/027G03F 7/0233G03F 7/0226C09D 179/08C08L 2203/20C08L 77/00
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Claims
Abstract
A photosensitive resin composition containing a resin and a compound each having a structure specified by the present specification provides a cured film having excellent adhesiveness to copper wiring.
Claims
exact text as granted — not AI-modified1 . A negative-type photosensitive resin composition, comprising:
(A) a polyimide precursor in the form of a polyamic acid, polyamic acid ester or polyamic acid salt represented by the following general formula (18):
{wherein, X 1 and X 2 respectively and independently represent a tetravalent organic group, Y 1 and Y 2 respectively and independently represent a divalent organic group, n1 and n2 respectively and independently represent an integer of 2 to 150, and R 1 and R 2 respectively and independently represent a hydrogen atom, saturated aliphatic group having 1 to 30 carbon atoms, aromatic group, monovalent organic group represented by the following general formula (2):
(wherein, R 3 , R 4 and R 5 respectively and independently represent a hydrogen atom or organic group having 1 to 3 carbon atoms, and m 1 represents an integer of 2 to 10), or monovalent ammonium ion represented by the following general formula (3):
(wherein, R 6 , R 7 and R 8 respectively and independently represent a hydrogen atom or organic group having 1 to 3 carbon atoms, and m 2 represents an integer of 2 to 10), provided that X 1 and X 2 are not the same and Y 1 and Y 2 are not the same};
(B) a photosensitizer; and,
(C) a solvent.
2 . The negative-type photosensitive resin composition according to claim 1 , wherein X 1 and X 2 in general formula (18) are at least one selected from the group consisting of a group represented by the following general formula (4):
{wherein, a1 represents an integer of 0 to 2, R 9 represents a hydrogen atom, fluorine atom or monovalent organic group having 1 to 10 carbon atoms, and in the case a plurality of R 9 are present, may be mutually the same or different}, a group represented by the following general formula (5):
{wherein, a2 and a3 respectively and independently represent an integer of 0 to 4, a4 and a5 respectively and independently represent an integer of 0 to 3, R 10 to R 13 respectively and independently represent a hydrogen atom, fluorine atom or monovalent organic group having 1 to 10 carbon atoms, and in the case a plurality of R 10 to R 13 are present, may mutually be the same or different}, a group represented by the following general formula (6):
{wherein, n2 represents an integer of 0 to 5, X n1 represents a single bond or divalent organic group, in the case a plurality of X n1 are present, may mutually be the same or different, X m1 represents a single bond or divalent organic group, at least one of X m1 and X n1 represents a single bond or an organic group selected from the group consisting of an oxycarbonyl group, oxycarbonylmethylene group, carbonylamino group, carbonyl group and sulfonyl group, a6 and a8 respectively and independently represent an integer of 0 to 3, a7 represents an integer of 0 to 4, R 14 , R 15 and R 16 respectively and independently represent a hydrogen atom, fluorine atom or monovalent organic group having 1 to 10 carbon atoms, and in the case a plurality of R 14 , R 15 and R 16 are present, may mutually be the same or different}, and a group represented by the following general formula (8):
{wherein, n4 represents an integer of 0 to 5, X m2 and X n3 respectively and independently represent an organic group having 1 to 10 carbon atoms that may contain a fluorine atom but does not contain a heteroatom other than fluorine, an oxygen atom or a sulfur atom, in the case of a plurality of X n3 are present, may be mutually the same or different, all and a13 respectively and independently represent an integer of 0 to 3, a12 represents an integer of 0 to 4, R 19 , R 20 and R 21 respectively and independently represent a hydrogen atom, fluorine atom or monovalent organic group having 1 to 10 carbon atoms, and in the case of a plurality of R 19 , R 20 and R 21 are present, may mutually be the same or different}.
3 . The negative-type photosensitive resin composition according to claim 1 , wherein Y 1 and Y 2 in general formula (18) represent at least one selected from the group consisting of a group represented by the following general formula (7):
{wherein, n3 represents an integer of 1 to 5, Y n2 represents an organic group having 1 to 10 carbon atoms that may contain a fluorine atom but does not contain a heteroatom other than fluorine, an oxygen atom or a sulfur atom, in the case a plurality of Y n2 are present, may mutually be the same or different, a9 and a10 respectively and independently represent an integer of 0 to 4, R 17 and R 18 respectively and independently represent a hydrogen atom, fluorine atom or monovalent organic group having 1 to 10 carbon atoms, and in the case a plurality of R 17 and R 18 are present, may mutually be the same or different}, a group represented by the following general formula (9):
{wherein, n5 represents an integer of 0 to 5, Y n4 represents a single bond or a divalent organic group, in the case of a plurality of Y n4 are present, may be mutually the same or different, in the case n4 is 2 or more, at least one of Y n4 represents a single bond or an organic group selected from the group consisting of an oxycarbonyl group, oxycarbonylmethylene group, carbonylamino group, carbonyl group and sulfonyl group, a14 and a15 respectively and independently represent an integer of 0 to 4, R 22 and R 23 respectively and independently represent a hydrogen atom, fluorine atom or monovalent organic group having 1 to 10 carbon atoms, and in the case a plurality of R 22 and R 23 are present, may be mutually the same or different}, and a group represented by the following general formula (10):
{wherein, a16 to a19 respectively and independently represent an integer of 0 to 4, R 24 to R 27 respectively and independently represent a hydrogen atom, fluorine atom or monovalent organic group having 1 to 10 carbon atoms, and in the case a plurality of R 24 to R 27 are present, may mutually be the same or different}.
4 . The negative-type photosensitive resin composition according to claim 2 , wherein at least one of X 1 and X 2 in general formula (18) is selected from the group consisting of those represented by general formulas (4), (5), (6) and (8), and at least one of Y 1 and Y 2 in general formula (18) is selected from the group consisting of those represented by the following general formulas (7), (9) and (10):
{wherein, n3 represents an integer of 1 to 5, Y n2 represents an organic group having 1 to 10 carbon atoms that may contain a fluorine atom but does not contain a heteroatom other than fluorine, an oxygen atom or a sulfur atom, in the case a plurality of Y n2 are present, may mutually be the same or different, a9 and a10 respectively and independently represent an integer of 0 to 4, R 17 and R 18 respectively and independently represent a hydrogen atom, fluorine atom or monovalent organic group having 1 to 10 carbon atoms, and in the case a plurality of R 17 and R 18 are present, may mutually be the same or different},
{wherein, n5 represents an integer of 0 to 5, Y n4 represents a single bond or a divalent organic group, in the case of a plurality of Y n4 are present, may be mutually the same or different, in the case n4 is 2 or more, at least one of Y n4 represents a single bond or an organic group selected from the group consisting of an oxycarbonyl group, oxycarbonylmethylene group, carbonylamino group, carbonyl group and sulfonyl group, a14 and a15 respectively and independently represent an integer of 0 to 4, R 22 and R 23 respectively and independently represent a hydrogen atom, fluorine atom or monovalent organic group having 1 to 10 carbon atoms, and in the case a plurality of R 22 and R 23 are present, may be mutually the same or different}, and
{wherein, a16 to a19 respectively and independently represent an integer of 0 to 4, R 24 to R 27 respectively and independently represent a hydrogen atom, fluorine atom or monovalent organic group having 1 to 10 carbon atoms, and in the case a plurality of R 24 to R 27 are present, may mutually be the same or different}.
5 . The negative-type photosensitive resin composition according to claim 2 , wherein, in general formula (18), at least one of X 1 and X 2 is represented by general formula (8) and at least one of Y 1 and Y2 is represented by the following general formula (7):
{wherein, n3 represents an integer of 1 to 5, Y n2 represents an organic group having 1 to 10 carbon atoms that may contain a fluorine atom but does not contain a heteroatom other than fluorine, an oxygen atom or a sulfur atom, in the case a plurality of Y n2 are present, may mutually be the same or different, a9 and a10 respectively and independently represent an integer of 0 to 4, R 17 and R 18 respectively and independently represent a hydrogen atom, fluorine atom or monovalent organic group having 1 to 10 carbon atoms, and in the case a plurality of R 17 and R 18 are present, may mutually be the same or different}.
6 . The negative-type photosensitive resin composition according to claim 2 , wherein, in general formula (18), X 1 is represented by general formula (8) and Y 1 is represented by the following general formula (7):
{wherein, n3 represents an integer of 1 to 5, Y n2 represents an organic group having 1 to 10 carbon atoms that may contain a fluorine atom but does not contain a heteroatom other than fluorine, an oxygen atom or a sulfur atom, in the case a plurality of Y n2 are present, may mutually be the same or different, a9 and a10 respectively and independently represent an integer of 0 to 4, R 17 and R 18 respectively and independently represent a hydrogen atom, fluorine atom or monovalent organic group having 1 to 10 carbon atoms, and in the case a plurality of R 17 and R 18 are present, may mutually be the same or different}.
7 . The negative-type photosensitive resin composition according to claim 1 , wherein the solvent (C) includes at least one selected from the group consisting of N-methyl-2-pyrrolidone, γ-butyrolactone, dimethylsulfoxide, tetrahydrofurfuryl alcohol, ethyl acetoacetate, dimethyl succinate, dimethyl malonate, N,N-dimethylacetoacetamide, ε-caprolactone, and 1,3-dimethyl-2-imidazolidinone.
8 . The negative-type photosensitive resin composition according to claim 7 , wherein the solvent (C) includes at least two selected from the group consisting of N-methyl-2-pyrrolidone, γ-butyrolactone, dimethylsulfoxide, tetrahydrofurfuryl alcohol, ethyl acetoacetate, dimethyl succinate, dimethyl malonate, N,N-dimethylacetoacetamide, ε-caprolactone, and 1,3-dimethyl-2-imidazolidinone.
9 . The negative-type photosensitive resin composition according to claim 8 , wherein the solvent (C) includes γ-butyrolactone and dimethylsulfoxide.
10 . A photosensitive resin composition containing a photosensitive polyimide precursor, wherein a focus margin of a rounded-out concave relief pattern is 8 μm or more, the rounded-out concave relief pattern being obtained by carrying out the following in order:
spin-coating the resin composition onto a sputtered Cu wafer substrate;
obtaining a spin-coated film having a film thickness of 13 μm by heating the spin-coated wafer substrate on a hot plate for 270 seconds at 110° C.;
exposing a rounded-out concave pattern with a mask size of 8 μm by changing the focus from the surface of the film to the bottom of the film 2 μm at a time using the surface of the spin-coated film as a reference;
forming a relief pattern by developing the exposed wafer; and
heat-treating the developed wafer in a nitrogen atmosphere for 2 hours at 230° C.
11 . The photosensitive resin composition according to claim 10 , wherein the focus margin is 12 μm or more.
12 . The photosensitive resin composition according to claim 10 , wherein the cross-sectional angle of a cured product of the photosensitive polyimide precursor in the form of a cured relief pattern is 60° to 90°.
13 . The photosensitive resin composition according to claim 10 , wherein the photosensitive polyimide precursor is a polyamic acid derivative having a radical-polymerizable substituent in a side chain thereof.
14 . The photosensitive resin composition according to claim 10 , wherein the photosensitive polyimide precursor contains a structure represented by the following general formula (21):
{wherein, X 1a represents a tetravalent organic group, Y 1a represents a divalent organic group, n 1a represents an integer of 2 to 150, and R 1a and R 2a respectively and independently represent a hydrogen atom, monovalent organic group represented by the following general formula (22):
(wherein, R 3a , R 4a and R 5a respectively and independently represent a hydrogen atom or organic group having 1 to 3 carbon atoms, and m 1a represents an integer of 2 to 10), or a saturated aliphatic group having 1 to 4 carbon atoms, provided that R 1a and R 2a are not both simultaneously hydrogen atoms}.
15 . The photosensitive resin composition according to claim 14 , wherein, in general formula (21), X 1a represents at least one tetravalent organic group selected from group consisting of the following formulas (23) to (25):
and Y 1a represents at least one divalent organic group selected from the group consisting of a group represented by the following general formula (26):
{wherein, R 6a to R 9a represent hydrogen atoms or monovalent aliphatic groups having 1 to 4 carbon atoms and may mutually be the same or different}, a group represented by the following formula (27):
and a group represented by the following formula (28):
{wherein, R 10a and R 11a respectively and independently represent a fluorine atom, trifluoromethyl group or methyl group}.
16 . The photosensitive resin composition according to claim 10 , further containing a photopolymerization initiator.
17 . The photosensitive resin composition according to claim 16 , wherein the photopolymerization initiator contains a component represented by the following general formula (29):
{wherein, Z represents a sulfur atom or oxygen atom, R 12a represents a methyl group, phenyl group or divalent organic group, and R 13a to R 15a respectively and independently represent a hydrogen atom or monovalent organic group}.
18 . The photosensitive resin composition according to claim 10 , further containing an inhibitor.
19 . The photosensitive resin composition according to claim 18 , wherein the inhibitor is at least one selected from the group consisting of a hindered phenol-type inhibitor and nitroso-type inhibitor.
20 . A method for producing a cured relief pattern comprising:
forming a photosensitive resin layer on a substrate by coating the photosensitive resin composition according to claim 10 on the substrate; exposing the photosensitive resin layer to light; forming a relief pattern by developing the photosensitive resin layer after exposing to light; and forming a cured relief pattern by heat-treating the relief pattern.
21 . The method according to claim 20 , wherein the substrate comprises copper or copper alloy.Cited by (0)
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