US2021050177A1PendingUtilityA1

Systems and methods for providing an ion beam

55
Assignee: HIL APPLIED MEDICAL LTDPriority: Oct 11, 2017Filed: Oct 15, 2020Published: Feb 18, 2021
Est. expiryOct 11, 2037(~11.2 yrs left)· nominal 20-yr term from priority
A61N 5/1079G21K 5/04G21K 1/093A61N 2005/1087H01J 37/147H01J 27/24
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Claims

Abstract

Systems for directing a pulsed beam of charged particles include an ion source configured to produce a pulsed ion beam that includes at least one ion bunch. Such systems include an electromagnet for producing an electromagnetic field through which the pulsed ion beam travels, and an automated switch that selectively activates the electromagnet. A source of radiation triggers the automated switch, and at least one processor is configured to activate the electromagnet as the ion bunch traverses the electromagnetic field. Such systems may be useful, for example, for filtering a pulsed ion beam to select ions falling within a desired energy range and/or for providing pulsed ion radiation at desired times.

Claims

exact text as granted — not AI-modified
1 - 13 . (canceled) 
     
     
         14 . A system for generating a beam of charged particles, the system comprising:
 an interaction chamber configured to support a target at a target location;   an electromagnetic radiation source configured to provide an electromagnetic radiation beam along a trajectory, the electromagnetic radiation beam having an energy, a polarization, a spatial profile, and a temporal profile;   one or more optics components positioned along the trajectory of the electromagnetic radiation beam, the one or more optics components being configured to cooperate with the electromagnetic radiation beam to cause the electromagnetic radiation beam to irradiate the target, thereby facilitating formation of a beam of charged particles having an energy and a flux; and   at least one processor configured to control at least one of the electromagnetic radiation source or the one or more optics components to thereby alter at least one of the energy of the electromagnetic radiation beam, the polarization of the electromagnetic radiation beam, the spatial profile of the electromagnetic radiation beam, or the temporal profile of the electromagnetic radiation beam, in order to adjust at least one of the flux of the beam of charged particles or the energy of the beam of charged particles.   
     
     
         15 . The system of claim  1 , wherein the at least one processor is configured to adjust the flux of the beam of charged particles while holding the energy of the beam of charged particles substantially constant. 
     
     
         16 . The system of claim  1 , wherein the at least one processor is configured to adjust the flux of the beam of charged particles while varying the energy of the beam of charged particles. 
     
     
         17 . The system of claim  1 , wherein the at least one processor is configured to adjust the energy of the beam of charged particles while holding the flux of the beam of charged particles substantially constant. 
     
     
         18 . The system of claim  1 , wherein the at least one processor is configured to adjust the energy of the beam of charged particles while varying the flux of the beam of charged particles. 
     
     
         19 . The system of claim  1 , wherein the at least one processor is configured to alter the spatial profile of the electromagnetic radiation beam by altering a spot size of the electromagnetic radiation beam. 
     
     
         20 . The system of claim  1 , wherein the at least one processor is configured to alter the temporal profile of the electromagnetic radiation beam by altering a chirp of the electromagnetic radiation beam. 
     
     
         21 . The system of claim  1 , wherein the at least one processor is configured to alter the temporal profile of the electromagnetic radiation beam by altering a timing of one or more pump sources. 
     
     
         22 . The system of claim  1 , wherein the electromagnetic radiation beam is not polarized. 
     
     
         23 . The system of claim  1 , wherein the electromagnetic radiation source is configured to provide a pulsed electromagnetic radiation beam and to thereby cause a pulsed beam of charged particles. 
     
     
         24 . The system of claim  1 , wherein the at least one processor is configured to cause the electromagnetic radiation source to change the energy of the electromagnetic radiation beam and the temporal profile of the electromagnetic radiation beam. 
     
     
         25 . The system of claim  1 , wherein the at least one processor is configured to cause the electromagnetic radiation source to change the energy of the electromagnetic radiation beam and the spatial profile of the electromagnetic radiation beam. 
     
     
         26 . The system of claim  1 , wherein the at least one processor is configured to cause the electromagnetic radiation source to change the energy of the electromagnetic radiation beam, and the at least one processor is configured to cause the one or more optics components to change the spatial profile of the electromagnetic radiation beam. 
     
     
         27 . The system of claim  1 , wherein the at least one processor is configured to cause the one or more optics components to change the energy of the electromagnetic radiation beam and the spatial profile of the electromagnetic radiation beam. 
     
     
         28 . A method for generating a beam of charged particles, the method comprising:
 supporting a target at a target location;   using an electromagnetic radiation source to provide an electromagnetic radiation beam along a trajectory, the electromagnetic radiation beam having an energy, a polarization, a spatial profile, and a temporal profile;   using one or more optics components positioned along the trajectory of the electromagnetic radiation beam to cause the electromagnetic radiation beam to irradiate the target, thereby facilitating formation of a beam of charged particles having an energy and a flux; and   controlling at least one of the electromagnetic radiation source or the one or more optics components to thereby alter at least one of the energy of the electromagnetic radiation beam, the polarization of the electromagnetic radiation beam, the spatial profile of the electromagnetic radiation beam, or the temporal profile of the electromagnetic radiation beam, in order to adjust at least one of the flux of the beam of charged particles or the energy of the beam of charged particles.   
     
     
         29 . The method of  claim 15 , wherein the beam of charged particles includes negatively charged particles. 
     
     
         30 . The method of  claim 15 , wherein the beam of charged particles includes positively charged particles. 
     
     
         31 . The method of  claim 15 , wherein the electromagnetic radiation source is configured to provide a pulsed electromagnetic radiation beam and to thereby cause a pulsed beam of changed particles. 
     
     
         32 . The method of  claim 15 , wherein adjusting the energy of the electromagnetic radiation beam is achieved by changing the temporal profile of the electromagnetic radiation beam. 
     
     
         33 . The method of  claim 15 , wherein adjusting the energy of the electromagnetic radiation beam is achieved by changing the spatial profile of the electromagnetic radiation beam.

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