Method and system for detecting inclusions in float glass based on wavelength(s) analysis

Abstract

A method and/or system is provided for detecting inclusions (e.g., nickel sulfide based inclusions/defects) in soda-lime-silica based glass, such as float glass. In certain example instances, during and/or after the glass-making process, following the stage in the float process where the glass sheet is formed and floated on a molten material (e.g., tin bath) and cooled or allowed to cool such as via an annealing lehr, light is directed at the resulting glass and reflection of various wavelengths (e.g., red and blue wavelengths) is analyzed to detect inclusions.

What is claimed is: 
     
         1 . A method comprising:
 directing light from at least one light source toward soda-lime-silica based glass on a float glass line; and   determining whether a nickel sulfide related defect is present in the glass based at least on a difference between how first and second reflected wavelengths from the directed light are diffracted, scattered, and/or reflected,   wherein one or both of the first and second reflected wavelengths is/are outside of the visible spectrum.   
     
     
         2 . The method of  claim 1 , wherein one of the first and second reflected wavelengths is in the near infrared. 
     
     
         3 . The method of  claim 1 , wherein one of the first and second reflected wavelengths has a wavelength of 700-1200 nm. 
     
     
         4 . The method of  claim 1 , wherein comprising collecting the first and second reflected wavelengths using at least one light detector. 
     
     
         5 . The method of  claim 4 , wherein the at least one light source and the at least one light detector are located on a common side of the glass. 
     
     
         6 . A method of detecting an inclusion in glass, the method comprising:
 directing first light from a first light source toward the glass;   directing second light from a second light source toward the glass; and   determining whether an inclusion comprising nickel sulfide is present in the glass based at least on a difference between diffraction, scattering, and/or reflection of first and second reflected wavelengths from the first and second light.   
     
     
         7 . The method of  claim 6 , wherein one or both of the first and second reflected wavelengths is/are outside of the visible spectrum. 
     
     
         8 . The method of  claim 7 , wherein one of the first and second reflected wavelengths is in the near infrared. 
     
     
         9 . The method of  claim 7 , wherein one of the first and second reflected wavelengths has a wavelength of 700-1200 nm. 
     
     
         10 . The method of  claim 6 , wherein both of the first and second reflected wavelengths are outside of the visible spectrum. 
     
     
         11 . The method of  claim 10 , wherein both of the first and second reflected wavelengths are in the near infrared. 
     
     
         12 . The method of  claim 10 , wherein the first reflected wavelength is in the UV and the second reflected wavelength is in the near infrared. 
     
     
         13 . The method of  claim 6 , wherein the directing of the first and second light and determining are performed in-line. 
     
     
         14 . The method of  claim 6 , further comprising collecting the first and second reflected wavelengths using one or more sensors, the one or more sensors and the first and second light sources being provided on a common side of the glass. 
     
     
         15 . The method of  claim 6 , wherein the glass is soda-lime-silicate glass. 
     
     
         16 . A method of detecting an inclusion in glass, the method comprising:
 directing light from at least one light source toward the glass; and   determining whether an inclusion comprising nickel sulfide is present in the glass based at least on a respective difference between diffraction, scattering, and/or reflection of first and second reflected wavelengths from the directed light.   
     
     
         17 . The method of  claim 16 , wherein the first and second reflected wavelengths originate from different light sources. 
     
     
         18 . The method of  claim 16 , wherein one or both of the first and second reflected wavelengths is/are outside of the visible spectrum. 
     
     
         19 . The method of  claim 18 , wherein one of the first and second reflected wavelengths is in the near infrared. 
     
     
         20 . The method of  claim 18 , wherein one of the first and second reflected wavelengths has a wavelength of 700-1200 nm.