Method and system for high-resolution x-ray detection for phase contrast x-ray imaging

Abstract

A phase contrast X-ray imaging system for imaging an object including an X-ray source; and an X-ray detector having a 25 micron or less pixel pitch; wherein a distance between the X-ray source and the object is less than or equal to 10 cm. The X-ray detector further includes at least one single direct conversion layer to acquire at least one phase contrast edge-enhancement image.

We claim: 
     
         1 . A phase contrast X-ray imaging system for imaging an object comprising:
 an X-ray source; and   a X-ray detector having a pixel pitch less than 25 microns;   wherein the X-ray detector includes at least one single direct conversion layer to acquire at least one phase contrast edge-enhancement image; and   wherein a focal spot of the X-ray source is less than or equal to 10 μm.   
     
     
         2 . The phase contrast X-ray imaging system of  claim 1  wherein the at least one single direct conversion layer comprises a photoconductor layer. 
     
     
         3 . The phase contrast X-ray imaging system of  claim 2  wherein the photoconductor layer comprises amorphous selenium, silicon, cadmium zine telluride (CdZnTe), cadmium telluride (CdTe), mercury iodide (HgI2), lead oxide (PbO) or scintillator infused organic photoconductors. 
     
     
         4 . The phase contrast X-ray imaging system of  claim 1  wherein the X-ray detector includes at least three direct conversion layers. 
     
     
         5 . The phase contrast X-ray imaging system of  claim 1  wherein the X-ray source comprises micro-focus X-ray tubes. 
     
     
         6 . The phase contrast X-ray imaging system of  claim 5  wherein the micro-focus X-ray tubes comprise metal jet X-rays. 
     
     
         7 . A method of phase contrast X-ray imaging comprising:
 placing an X-ray source a distance R 1  away from an object to be imaged;   placing an X-ray detector a distance R 2  away from the object to be imaged;   directing a polychromatic beam at the object via the X-ray source;   detecting the X-ray photons via the X-ray detector; and   acquiring at least one phase contrast edge-enhancement image;   wherein the X-ray detector includes pixels having a pitch size less than 25 microns.   
     
     
         8 . The method of  claim 7  wherein the directing a polychromatic beam at the object via the X-ray source comprises:
 directing the polychromatic beam from a metal jet X-ray source. 
 
     
     
         9 . The method of  claim 7  wherein the acquiring at least one phase contrast edge-enhancement image comprises:
 detecting the at least one phase contrast edge-enhancement via a direct conversion layer. 
 
     
     
         10 . The method of  claim 9  wherein the direct conversion layer comprises amorphous selenium, silicon, cadmium zine telluride (CdZnTe), cadmium telluride (CdTe), mercury iodide (HgI2), lead oxide (PbO) or scintillator infused organic photoconductors. 
     
     
         11 . A phase contrast X-ray imaging system for imaging an object comprising:
 an X-ray source; and   a X-ray detector having a pixel pitch less than 25 micron and at least one direct conversion layer to acquire at least one phase contrast edge-enhancement image.   
     
     
         12 . The phase contrast X-ray imaging system of  claim 11  wherein the at least one single direct conversion layer comprises a photoconductor layer. 
     
     
         13 . The phase contrast X-ray imaging system of  claim 12  wherein the photoconductor layer comprises amorphous selenium, silicon, cadmium zine telluride (CdZnTe), cadmium telluride (CdTe), mercury iodide (HgI2), lead oxide (PbO) or scintillator infused organic photoconductors. 
     
     
         14 . The phase contrast X-ray imaging system of  claim 11  wherein the X-ray detector includes at least three direct conversion layers. 
     
     
         15 . The phase contrast X-ray imaging system of  claim 11  wherein the X-ray source comprises micro-focus X-ray tubes. 
     
     
         16 . The phase contrast X-ray imaging system of  claim 15  wherein the micro-focus X-ray tubes comprises metal jet X-rays. 
     
     
         17 . The phase contrast X-ray imaging system of  claim 11  wherein the at least one contrast edge-enhancement image is used to form a computed tomography image. 
     
     
         18 . The phase contrast X-ray imaging system of  claim 1  wherein the at least one contrast edge-enhancement image is used to form a computed tomography image. 
     
     
         19 . The method of  claim 7  further comprising:
 generating a computed tomography image using the at least one contrast edge-enhancement image. 
 
     
     
         20 . The phase contrast X-ray imaging system of  claim 17  wherein the computer tomography image is a phase contrast edge-enhancement computed tomography image.