Reprocessing of Medical Devices that Are Contaminated with Bacteria, Viruses, Other Pathogens, and Biofilms with Shockwaves, Pressure Waves or Ultrasound Systems

Abstract

A reusable apparatus, such as a medical instrument or tool, is decontaminated by applying at least one of pressure waves, shockwaves, and ultrasound waves in a sufficient dosage to remove contamination but without adversely affecting the ability to reuse the apparatus.

What is claimed is: 
     
         1 . A method for decontaminating a reusable apparatus comprising applying at least one of pressure waves, shockwaves, and ultrasound waves in a sufficient dosage to remove a contaminated condition of the apparatus without materially and adversely affecting reuse of the apparatus for its intended purpose. 
     
     
         2 . The method of  claim 1 , the apparatus is reusable in medicine. 
     
     
         3 . The method of  claim 2 , wherein the apparatus is tubing. 
     
     
         4 . The method of  claim 3 , wherein the apparatus is an endoscope. 
     
     
         5 . The method of  claim 3 , wherein the apparatus is dialysis machine or ventilator tubing. 
     
     
         6 . The method of  claim 5 , wherein the contaminated condition includes at least one of bacterial, fungal, and viral contamination. 
     
     
         7 . The method of  claim 4 , wherein the contaminated condition includes at least one of bacterial, fungal, and viral contamination. 
     
     
         8 . The method of  claim 3 , wherein the contaminated condition includes at least one of bacterial, fungal, and viral contamination. 
     
     
         9 . The method of  claim 2 , wherein the contaminated condition includes at least one of bacterial, fungal, and viral contamination. 
     
     
         10 . The method of  claim 1 , wherein the contaminated condition includes at least one of bacterial, fungal, and viral contamination. 
     
     
         11 . The method of  claim 1 , wherein the contaminated condition includes particulates. 
     
     
         12 . The method of  claim 2 , wherein the contaminated condition includes particulates. 
     
     
         13 . The method of  claim 3 , wherein the contaminated condition includes particulates. 
     
     
         14 . The method of  claim 4 , wherein the contaminated condition includes particulates. 
     
     
         13 . The method of  claim 1 , further comprising applying shockwaves generated by a spark gap. 
     
     
         14 . The method of  claim 2 , further comprising applying shockwaves generated by a spark gap. 
     
     
         15 . The method of  claim 3 , further comprising applying shockwaves generated by a spark gap. 
     
     
         16 . The method of  claim 4 , further comprising applying shockwaves generated by a spark gap. 
     
     
         17 . The method of  claim 16 , further comprising using a reflector to direct the shockwaves. 
     
     
         18 . The method of  claim 13 , further comprising using a reflector to direct the shockwaves. 
     
     
         19 . The method of  claim 14 , further comprising using a reflector to direct the shockwaves. 
     
     
         20 . The method of  claim 1 , further comprising using a reflector to direct at least one of shockwaves and pressure waves.